Invention Grant
- Patent Title: Method and system for spectral imaging
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Application No.: US14438641Application Date: 2013-10-24
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Publication No.: US09915565B2Publication Date: 2018-03-13
- Inventor: Nir Katzir
- Applicant: Applied Spectral Imaging Ltd.
- Applicant Address: IL Yokneam
- Assignee: Applied Spectral Imaging Ltd.
- Current Assignee: Applied Spectral Imaging Ltd.
- Current Assignee Address: IL Yokneam
- International Application: PCT/IL2013/050868 WO 20131024
- International Announcement: WO2014/064701 WO 20140501
- Main IPC: G01J3/45
- IPC: G01J3/45 ; G01J3/453 ; G02B27/14 ; G01J3/28 ; G01J3/02

Abstract:
A method of calibrating a spectral imaging system is disclosed. The spectral imaging system comprises an interferometer having a beam splitter and at least a first reflector and a second reflector. The method comprises: obtaining data pertaining to an interference pattern model, operating the spectral imaging system to provide an interference pattern of a received light beam, and varying a relative orientation between at least two of: the beam splitter, the first reflector and the second reflector, until the interference pattern of the input light beam substantially matches the interference pattern model.
Public/Granted literature
- US20150285686A1 METHOD AND SYSTEM FOR SPECTRAL IMAGING Public/Granted day:2015-10-08
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