- Patent Title: Microparticle analysis apparatus and microparticle analysis system
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Application No.: US14763980Application Date: 2013-12-26
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Publication No.: US09915599B2Publication Date: 2018-03-13
- Inventor: Marcaurele Brun , Kazumasa Sato , Shinji Omori , Yoichi Katsumoto
- Applicant: Sony Corporation
- Applicant Address: JP Tokyo
- Assignee: Sony Corporation
- Current Assignee: Sony Corporation
- Current Assignee Address: JP Tokyo
- Agency: Wolf, Greenfield & Sacks, P.C.
- Priority: JP2013-023374 20130208
- International Application: PCT/JP2013/084878 WO 20131226
- International Announcement: WO2014/122873 WO 20140814
- Main IPC: G01N15/10
- IPC: G01N15/10 ; G01N27/22 ; G01N33/487 ; G01N15/12 ; G01N15/00

Abstract:
There is provided a microparticle analysis apparatus including a sample channel configured to receive liquid containing a plurality of microparticles, a first pair of electrodes configured to form an alternating electric field in at least a part of the sample channel, a measuring part configured to measure impedance between the first pair of electrodes, an analyzing part configured to calculate property values of the microparticles from the impedance measured in the measuring part, and a determining part configured to determine whether data of the impedance measured in the measuring part is derived from the microparticles.
Public/Granted literature
- US20150377763A1 MICROPARTICLE ANALYSIS APPARATUS AND MICROPARTICLE ANALYSIS SYSTEM Public/Granted day:2015-12-31
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