- 专利标题: Electronic lateral flow test arrangement and method
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申请号: US14363449申请日: 2012-12-06
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公开(公告)号: US09921228B2公开(公告)日: 2018-03-20
- 发明人: Viet Nguyen , Franciscus Petrus Widdershoven , Roel Daamen
- 申请人: NXP B.V.
- 申请人地址: NL Eindhoven
- 专利权人: NXP B.V.
- 当前专利权人: NXP B.V.
- 当前专利权人地址: NL Eindhoven
- 优先权: EP11192423 20111207
- 国际申请: PCT/EP2012/074624 WO 20121206
- 国际公布: WO2013/083686 WO 20130613
- 主分类号: G01N33/50
- IPC分类号: G01N33/50 ; G01N33/68 ; G01N33/558 ; G01N33/543 ; G01N27/327
摘要:
A lateral test flow arrangement for a test molecule is disclosed, comprising: a test strip for transporting an analyte away from a sampling region and towards an absorbing region, the test strip having therein and remote from the sampling region, a test region for functionalization with a molecule which binds to the test molecule or to a conjugate of the test molecule; a sensing test capacitor having electrodes extending across the test strip at least partially aligned with the test region and being physically isolated therefrom; a reference test capacitor having electrodes extending across the test strip and being physically isolated therefrom; and an electronic circuit configured to measure a time-dependant capacitance difference between the sensing test capacitor and the reference test capacitor. A method for carrying out that lateral flow tests is also disclosed, as are test systems and in particular pregnancy test systems.
公开/授权文献
- US20140323350A1 ELECTRONIC LATERAL FLOW TEST ARRANGEMENT AND METHOD 公开/授权日:2014-10-30
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