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公开(公告)号：US09921228B2
公开(公告)日：2018-03-20
申请号：US14363449
申请日：2012-12-06
Applicant: NXP B.V.
Inventor： Viet Nguyen , Franciscus Petrus Widdershoven , Roel Daamen
IPC: G01N33/50 , G01N33/68 , G01N33/558 , G01N33/543 , G01N27/327
CPC classification number: G01N33/689 , G01N27/3274 , G01N33/5438 , G01N33/558
Abstract: A lateral test flow arrangement for a test molecule is disclosed, comprising: a test strip for transporting an analyte away from a sampling region and towards an absorbing region, the test strip having therein and remote from the sampling region, a test region for functionalization with a molecule which binds to the test molecule or to a conjugate of the test molecule; a sensing test capacitor having electrodes extending across the test strip at least partially aligned with the test region and being physically isolated therefrom; a reference test capacitor having electrodes extending across the test strip and being physically isolated therefrom; and an electronic circuit configured to measure a time-dependant capacitance difference between the sensing test capacitor and the reference test capacitor. A method for carrying out that lateral flow tests is also disclosed, as are test systems and in particular pregnancy test systems.
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Patent Agency Ranking
2.发明申请公开(公告)号：US20150028847A1
公开(公告)日：2015-01-29
申请号：US14307563
申请日：2014-06-18
Applicant: NXP B.V.
Inventor： Tony Vanhoucke , Viet Nguyen
CPC classification number: G01R31/2836 , G01R19/0092 , G06F21/73 , G06F2221/2103 , G09C1/00 , H04L9/0866 , H04L9/3278 , H04L2209/805
Abstract: A method of identifying a component by a response to a challenge is disclosed, the component comprising an array of bipolar transistors connectable in parallel so as to have a common collector contact, a common emitter contact and a common base contact, the challenge comprising a value representative of a total collector current value, the method comprising: receiving the challenge; supplying the total collector current to the common collector contact; detecting instability in each of a group of the transistors; and determining the response in dependence on the group. A circuit configured to operate such a method is also disclosed.
Abstract translation: 公开了一种通过对挑战的响应来识别组件的方法，该组件包括可并联连接的双极晶体管阵列，以便具有共同的集电极接触，公共发射极接触和公共基极接触，该挑战包括值 代表总集电极电流值，该方法包括：接收挑战; 将总集电极电流提供给公共集电极触点; 检测一组晶体管中的每一个中的不稳定性; 并根据该组确定响应。 还公开了一种配置成操作这种方法的电路。
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公开(公告)号：US09390295B2
公开(公告)日：2016-07-12
申请号：US14293730
申请日：2014-06-02
Applicant: NXP B.V.
Inventor： Franciscus Franciscus Widdershoven , Viet Nguyen
CPC classification number: G06F21/87 , G06F21/77 , G09C1/00 , H01L23/576 , H01L2924/0002 , H04L9/0866 , H04L9/3278 , H01L2924/00
Abstract: The invention provides a semiconductor device comprising with a capacitive security shield structure which uses a set of randomly distributed dielectric or conducting particles formed within a dielectric layer. A set of electrodes can be configured as at least two sets, wherein a first set is used to measure a capacitance characteristic, and a second set is configured as non-measurement set. The electrode configuration can be altered so that multiple measurements can be obtained.
Abstract translation: 本发明提供了一种半导体器件，其包括具有电容性安全屏蔽结构，其使用在电介质层内形成的一组随机分布的电介质或导电颗粒。 一组电极可以被配置为至少两组，其中第一组用于测量电容特性，第二组被配置为非测量组。 可以改变电极配置，从而可以获得多次测量。
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公开(公告)号：US20140323350A1
公开(公告)日：2014-10-30
申请号：US14363449
申请日：2012-12-06
Applicant: NXP B.V.
Inventor： Viet Nguyen , Franciscus Petrus Widdershoven , Roel Daamen
IPC: G01N33/68 , G01N33/543 , G01N33/558
CPC classification number: G01N33/689 , G01N27/3274 , G01N33/5438 , G01N33/558
Abstract: A lateral test flow arrangement for a test molecule is disclosed, comprising: a test strip for transporting an analyte away from a sampling region and towards an absorbing region, the test strip having therein and remote from the sampling region, a test region for functionalization with a molecule which binds to the test molecule or to a conjugate of the test molecule; a sensing test capacitor having electrodes extending across the test strip at least partially aligned with the test region and being physically isolated therefrom; a reference test capacitor having electrodes extending across the test strip and being physically isolated therefrom; and an electronic circuit configured to measure a time-dependant capacitance difference between the sensing test capacitor and the reference test capacitor. A method for carrying out that lateral flow tests is also disclosed, as are test systems and in particular pregnancy test systems
Abstract translation: 公开了一种用于测试分子的横向测试流程布置，包括：测试条，用于将分析物从采样区域传输到吸收区域，测试条带在其中并且远离采样区域，测试区域用于与 结合测试分子或测试分子的缀合物的分子; 感测测试电容器，其具有延伸穿过所述测试条的电极，所述电极至少部分地与所述测试区域对齐并与其物理隔离; 参考测试电容器，其具有延伸穿过测试条并且与其物理隔离的电极; 以及电子电路，被配置为测量感测测试电容器和参考测试电容器之间的时间相关的电容差。 还公开了进行横向流动测试的方法，以及测试系统，特别是妊娠测试系统
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公开(公告)号：US10132858B2
公开(公告)日：2018-11-20
申请号：US14307563
申请日：2014-06-18
Applicant: NXP B.V.
Inventor： Tony Vanhoucke , Viet Nguyen
Abstract: A method of identifying a component by a response to a challenge is disclosed, the component comprising an array of bipolar transistors connectable in parallel so as to have a common collector contact, a common emitter contact and a common base contact, the challenge comprising a value representative of a total collector current value, the method comprising: receiving the challenge; supplying the total collector current to the common collector contact; detecting instability in each of a group of the transistors; and determining the response in dependence on the group. A circuit configured to operate such a method is also disclosed.
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公开(公告)号：US20150007353A1
公开(公告)日：2015-01-01
申请号：US14293730
申请日：2014-06-02
Applicant: NXP B.V.
Inventor： Franciscus Franciscus Widdershoven , Viet Nguyen
CPC classification number: G06F21/87 , G06F21/77 , G09C1/00 , H01L23/576 , H01L2924/0002 , H04L9/0866 , H04L9/3278 , H01L2924/00
Abstract: The invention provides a semiconductor device comprising with a capacitive security shield structure which uses a set of randomly distributed dielectric or conducting particles formed within a dielectric layer. A set of electrodes can be configured as at least two sets, wherein a first set is used to measure a capacitance characteristic, and a second set is configured as non-measurement set. The electrode configuration can be altered so that multiple measurements can be obtained.
Abstract translation: 本发明提供了一种半导体器件，其包括具有电容性安全屏蔽结构，其使用在电介质层内形成的一组随机分布的电介质或导电颗粒。 一组电极可以被配置为至少两组，其中第一组用于测量电容特性，第二组被配置为非测量组。 可以改变电极配置，从而可以获得多次测量。
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