- 专利标题: Device and method for image reconstruction at different X-ray energies, and device and method for X-ray three-dimensional measurement
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申请号: US14894325申请日: 2014-05-29
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公开(公告)号: US09928619B2公开(公告)日: 2018-03-27
- 发明人: Akira Monkawa , Shoichi Nakanishi , Shinya Abe , Mikiya Kondo , Koh Harada
- 申请人: TOKYO METROPOLITAN INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- 申请人地址: JP Tokyo
- 专利权人: Tokyo Metropolitan Industrial Technology Research Institute
- 当前专利权人: Tokyo Metropolitan Industrial Technology Research Institute
- 当前专利权人地址: JP Tokyo
- 代理机构: Sheppard, Mullin, Richter & Hampton LLP
- 优先权: JP2013-113498 20130529
- 国际申请: PCT/JP2014/064330 WO 20140529
- 国际公布: WO2014/192889 WO 20141204
- 主分类号: G06T11/00
- IPC分类号: G06T11/00 ; G01N23/04 ; G06K9/52 ; G06T7/00 ; H04N5/232 ; H04N13/00 ; H04N13/02 ; G01B15/04
摘要:
A device and a method for image reconstruction at different X-ray energies that make it possible to achieve image reconstruction with higher accuracy. A device for image reconstruction at different X-ray energies includes: an X-ray source 1 that irradiates a specimen to be imaged 2 with X-rays; an energy-dispersive detector 4 that detects a characteristic X-ray emitted from the specimen to be imaged 2; a signal processor that quantifies the peak of the characteristic X-ray detected by the detector 4; and an image reconstruction device that reconstructs an image on the basis of a signal from the signal processor.
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IPC分类:
G | 物理 |
G06 | 计算;推算或计数 |
G06T | 一般的图像数据处理或产生 |
G06T11/00 | 2D〔二维〕图像的生成 |