Invention Grant
- Patent Title: Automatic analyzing device
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Application No.: US14784359Application Date: 2014-04-03
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Publication No.: US09933447B2Publication Date: 2018-04-03
- Inventor: Hiroyuki Takayama , Kazuhiro Nakamura
- Applicant: HITACHI HIGH-TECHNOLOGIES CORPORATION
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Technologies Corporation
- Current Assignee: Hitachi High-Technologies Corporation
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JP2013-087413 20130418
- International Application: PCT/JP2014/059889 WO 20140403
- International Announcement: WO2014/171346 WO 20141023
- Main IPC: G01N35/00
- IPC: G01N35/00 ; G01N35/04 ; B08B3/08 ; G01N21/03

Abstract:
A rinse mechanism rinses reaction cuvettes with first and second detergents. An R1 reagent pipetting mechanism 8 rinses the reaction cuvettes that have been rinsed by the rinse mechanism with a special detergent. A counting unit counts and stores in a storage unit a use frequency of each reaction cuvette for a specific reagent item. A determining unit determines whether the counted use frequency exceeds a predetermined threshold N1. A control unit controls the R1 reagent pipetting mechanism such that, in a case where the counted use frequency exceeds the predetermined threshold N1, the reaction cuvettes, which have exceeded the predetermined threshold N1, are soaked with the special detergent only for a period equal to or less than a value derived by multiplying a pipetting cycle time, which indicates a period when a sample is pipetted, by the total number of reaction cuvettes and a predetermined integer.
Public/Granted literature
- US20160061852A1 AUTOMATIC ANALYZING DEVICE Public/Granted day:2016-03-03
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