Invention Grant
- Patent Title: Electro-optic probe with multiple sensitivity ranges
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Application No.: US14725243Application Date: 2015-05-29
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Publication No.: US09933456B2Publication Date: 2018-04-03
- Inventor: Michael J. Mende , Richard A. Booman
- Applicant: Tektronix, Inc.
- Applicant Address: US OR Beaverton
- Assignee: Tektronix, Inc.
- Current Assignee: Tektronix, Inc.
- Current Assignee Address: US OR Beaverton
- Agency: Marger Johnson
- Agent Andrew J. Harrington
- Main IPC: G01R1/07
- IPC: G01R1/07 ; G01R29/08 ; G02B6/42 ; G02F1/01 ; G02F1/035 ; G01R29/12

Abstract:
A test and measurement system including an electro-optical accessory with an electro-optical sensor configured to output a modulated output signal, a device under test connected to the electro-optical accessory with a variable input signal, and a processor. The electro-optical accessory includes two sets of electrodes in which a sensitivity of the first set of electrodes is different from a sensitivity of the second set of electrodes. The processor in the test and measurement system is configured to modify the modulated output signal from the electro-optical voltage accessory to reconstruct the variable input signal of the electro-optical voltage accessory that exceeds the linear input range of the optical sensor.
Public/Granted literature
- US20160349287A1 ELECTRO-OPTIC PROBE WITH MULTIPLE SENSITIVITY RANGES Public/Granted day:2016-12-01
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