公开(公告)号：USD947693S1

公开(公告)日：2022-04-05

申请号：US29706540

申请日：2019-09-20

Applicant: Tektronix, Inc.

Designer： David Thomas Engquist ,  Heather J. Vermilyea ,  Karl A. Rinder ,  Michael J. Mende ,  Tony Lee Tarr

公开(公告)号：US20180328962A1

公开(公告)日：2018-11-15

申请号：US15687316

申请日：2017-08-25

Applicant: Tektronix, Inc.

Inventor： Michael J. Mende ,  David T. Engquist ,  Richard A. Booman

IPC: G01R1/18 ,  G01R1/04 ,  G01R1/067

CPC classification number: G01R1/18 ,  G01R1/0416 ,  G01R1/06738 ,  G01R1/06772

Abstract: Disclosed is a differential test probe tip. The probe tip comprises a socket of electrically conductive material at a proximate end of the probe tip. The socket includes a concavity to receive a signal pin. The probe tip also comprises a reference body of conductive material surrounding the socket. The probe tip further comprises a insulating spacer element of non-conductive material surrounding the reference body at the proximate end of the probe tip. The insulating spacer element includes a signal port to receive the signal pin into the socket. The insulating spacer element further includes a reference port to receive a reference pin and maintain the reference pin in electrical communication with a proximate end of the reference body.

公开(公告)号：US20180328961A1

公开(公告)日：2018-11-15

申请号：US15721604

申请日：2017-09-29

Applicant: Tektronix, Inc.

Inventor： Michael J. Mende ,  Richard A. Booman ,  Wayne M. Wilburn

IPC: G01R1/067 ,  G01R1/073 ,  G01R31/319 ,  H03H1/02

CPC classification number: G01R1/06766 ,  G01R1/06772 ,  G01R1/07328 ,  G01R31/31905 ,  H03H1/02

Abstract: Disclosed is a test and measurement probe. The test and measurement probe includes a probe tip to connect to a Device Under Test (DUT). The probe tip includes a Resistor Capacitor (RC) probe tip network coupled to a test signal channel. The test and measurement probe also includes at least one variable resistor coupled to the test signal channel. The at least one variable resistor is set to provide an adjustable resistance to compensate for frequency variation in the RC probe tip network.

公开(公告)号：US20170271828A1

公开(公告)日：2017-09-21

申请号：US15257681

申请日：2016-09-06

Applicant: Tektronix, Inc.

Inventor： Michael J. Mende ,  Gary W. Reed ,  James D. Pileggi ,  Karl A. Rinder ,  Richard A. Booman

IPC: H01R24/54

CPC classification number: H01R24/542 ,  G01R1/0408 ,  H01R13/646 ,  H01R31/06 ,  H01R2103/00 ,  H01R2201/20

Abstract: A differential pin to RF adaptor includes a center conductor contact with an RF connector on one end and a signal contact on the other end. An insulating sleeve surrounds the central contact. A reference contact surrounds the insulating sleeve. The signal pin of the differential pair interfaces with the center conductor contact of the RF connector. The adaptor is structured to slide down over a pair of pins/leads so that the reference contact abuts a circuit board attached to the pins. The pins/leads are shielded all the way to the circuit board, which shields/isolates the pins from common mode and other types of interference. The adaptor maintains the shape of the signal pin and the reference pin during testing. The adaptor maintains a fixed impedance of the pins, which reduces or eliminates uncontrolled impedance and hence preserves system frequency response and reduces/eliminates erroneous ripple currents.

公开(公告)号：US20230266369A1

公开(公告)日：2023-08-24

申请号：US18138006

申请日：2023-04-21

Applicant: Tektronix, Inc.

Inventor： Michael J. Mende

IPC: G01R19/00 ,  G01R15/12

CPC classification number: G01R19/0015 ,  G01R15/125

Abstract: A test and measurement probe system, including an input to receive an input signal, the input signal including a low frequency (LF) and/or direct current (DC) component and an alternating current (AC) component, an extractor circuit, such as an AC coupling circuit or a LF and/or DC rejection circuit, configured to receive the input signal and to separate the AC component and the LF and/or DC component from the input signal, a first output to output the alternating current component to the test and measurement instrument, and a second output to output the direct current component to the test and measurement instrument. In some embodiments, the LF and/or DC component is digitized prior to being output by the second output.

公开(公告)号：US10585118B2

公开(公告)日：2020-03-10

申请号：US15721604

申请日：2017-09-29

Applicant: Tektronix, Inc.

Inventor： Michael J. Mende ,  Richard A. Booman ,  Wayne M. Wilburn

IPC: G01R31/20 ,  G01R1/067 ,  H03H1/02 ,  G01R31/319 ,  G01R1/073

Abstract: Disclosed is a test and measurement probe. The test and measurement probe includes a probe tip to connect to a Device Under Test (DUT). The probe tip includes a Resistor Capacitor (RC) probe tip network coupled to a test signal channel. The test and measurement probe also includes at least one variable resistor coupled to the test signal channel. The at least one variable resistor is set to provide an adjustable resistance to compensate for frequency variation in the RC probe tip network.

公开(公告)号：US09557399B2

公开(公告)日：2017-01-31

申请号：US14188299

申请日：2014-02-24

Applicant: Tektronix, Inc.

Inventor： Michael J. Mende ,  Richard A. Booman

IPC: G01R31/00 ,  G01R35/00 ,  G01R15/24 ,  G01R1/067

CPC classification number: G01R35/00 ,  G01R1/06766 ,  G01R15/24 ,  G01R31/00

Abstract: A test and measurement system including a device under test, an accessory, a controller and a test and measurement instrument. The accessory is connected to the device under test and includes a signal input to receive an input signal from the device under test, a compensation unit configured to apply a compensation signal internal to the accessory, and a signal output to output an output signal read from the device under test. The controller is connected to the accessory and includes one or more receivers to receive the input signal and the output signal from the accessory, and a microcontroller or correction circuit configured to compare the input signal and the output signal and in response to the comparison provide a compensation signal to the compensation unit.

Abstract translation: 包括被测设备，附件，控制器和测试和测量仪器的测试和测量系统。 附件被连接到被测设备，并且包括用于接收来自被测器件的输入信号的信号输入端，被配置为对附件内部施加补偿信号的补偿单元和输出从 被测设备。 控制器连接到附件并且包括一个或多个接收器，用于接收来自附件的输入信号和输出信号，以及配置成比较输入信号和输出信号的微控制器或校正电路，并且响应于该比较，提供一个 补偿信号到补偿单元。

公开(公告)号：US20150241543A1

公开(公告)日：2015-08-27

申请号：US14188299

申请日：2014-02-24

Applicant: Tektronix, Inc.

Inventor： Michael J. Mende ,  Richard A. Booman

IPC: G01R35/00 ,  G01R15/24 ,  G01R31/00

CPC classification number: G01R35/00 ,  G01R1/06766 ,  G01R15/24 ,  G01R31/00

Abstract: A test and measurement system including a device under test, an accessory, a controller and a test and measurement instrument. The accessory is connected to the device under test and includes a signal input to receive an input signal from the device under test, a compensation unit configured to apply a compensation signal internal to the accessory, and a signal output to output an output signal read from the device under test. The controller is connected to the accessory and includes one or more receivers to receive the input signal and the output signal from the accessory, and a microcontroller or correction circuit configured to compare the input signal and the output signal and in response to the comparison provide a compensation signal to the compensation unit.

Abstract translation: 包括被测设备，附件，控制器和测试和测量仪器的测试和测量系统。 附件被连接到被测设备，并且包括用于接收来自被测器件的输入信号的信号输入端，被配置为对附件内部施加补偿信号的补偿单元，以及输出从 被测设备。 控制器连接到附件并且包括一个或多个接收器，用于接收来自附件的输入信号和输出信号，以及被配置为比较输入信号和输出信号的微控制器或校正电路，并且响应于该比较，提供一个 补偿信号到补偿单元。

公开(公告)号：US20150054492A1

公开(公告)日：2015-02-26

申请号：US14061327

申请日：2013-10-23

Applicant: Tektronix, Inc.

Inventor： Michael J. Mende ,  Richard A. Booman

IPC: G01R15/12

CPC classification number: G01R15/125 ,  G01R1/06788 ,  G01R13/0272 ,  G01R19/2503

Abstract: The disclosed technology relates to a probe for use with a test and measurement instrument. The probe includes a digital multimeter or voltmeter with an analog-to-digital converter configured to measure a signal from a device under test and determine a digital measurement from the signal, a controller connected to the multimeter or voltmeter configured to receive the digital measurement from the multimeter or voltmeter, a digital communication interface connected to the controller configured to communicate with the controller, and a communication link connected to the digital communication interface and the analog signal interface to communicate with the test and measurement instrument.

Abstract translation: 所公开的技术涉及用于测试和测量仪器的探针。 该探头包括数字万用表或电压表，其具有模拟 - 数字转换器，其被配置为测量来自被测器件的信号，并且确定来自信号的数字测量，连接到万用表的控制器或被配置为接收数字测量的电压表 万用表或电压表，连接到控制器的数字通信接口，被配置为与控制器通信，以及连接到数字通信接口和模拟信号接口的通信链路，以与测试和测量仪器通信。

公开(公告)号：US11635452B2

公开(公告)日：2023-04-25

申请号：US16630371

申请日：2018-07-13

Applicant: Tektronix, Inc.

Inventor： Michael J. Mende

IPC: G01R19/00 ,  G01R15/12

Abstract: A test and measurement probe system (100,104), including an input (106) to receive an input signal, the input signal including a low frequency (LF) and/or direct current (DC) component and an alternating current (AC) component, an extractor circuit (110), such as an AC coupling circuit or a LF and/or DC rejection circuit, configured to receive the input signal and to separate the AC component and the LF and/or DC component from the input signal, a first output (118) to output the alternating current component to the test and measurement instrument, and a second output to output the direct current component to the test and measurement instrument. In some embodiments, the LF and/or DC component is digitized prior to being output by the second output.