Invention Grant
- Patent Title: Band overlay separator
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Application No.: US14674344Application Date: 2015-03-31
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Publication No.: US09933458B2Publication Date: 2018-04-03
- Inventor: John J. Pickerd , Kan Tan
- Applicant: Tektronix, Inc.
- Applicant Address: US OR Beaverton
- Assignee: Tektronix, Inc.
- Current Assignee: Tektronix, Inc.
- Current Assignee Address: US OR Beaverton
- Agent Marger Johnson; Kevin Dothager
- Main IPC: G05B11/32
- IPC: G05B11/32 ; G01R13/02 ; H03M1/10 ; G01R13/22 ; H03M1/12

Abstract:
A test and measurement instrument including a splitter configured to split an input signal into at least two split signals, at least two harmonic mixers configured to mix an associated split signal with an associated harmonic signal to generate an associated mixed signal, at least two digitizers configured to digitize the associated mixed signal, at least two MIMO polyphase filter arrays configured to filter the associated digitized mixed signal of an associated digitizer of the at least two digitizers, at least two pairs of band separation filters configured to receive the associated digitized mixed signals from each of the MIMO polyphase filter arrays and output a low band of the input signal and a high band of the input signal based on a time different between the at least two digitizers and a phase drift of a local oscillator, and a combiner configured to combine the low band of the input signal and the high band of the input signal to form a reconstructed input signal.
Public/Granted literature
- US20160291056A1 BAND OVERLAY SEPARATOR Public/Granted day:2016-10-06
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