- 专利标题: Apparatuses and methods for detecting frequency ranges corresponding to signal delays of conductive VIAS
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申请号: US15635071申请日: 2017-06-27
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公开(公告)号: US09934832B2公开(公告)日: 2018-04-03
- 发明人: Tomoyuki Shibata , Minehiko Uehara
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: Micron Technology, Inc.
- 当前专利权人: Micron Technology, Inc.
- 当前专利权人地址: US ID Boise
- 代理机构: Dorsey & Whitney LLP
- 主分类号: H03B19/00
- IPC分类号: H03B19/00 ; G11C7/22 ; H01L25/065 ; H03K5/26 ; H03K5/13 ; H03K5/156 ; G11C5/06 ; G11C8/18
摘要:
Apparatuses for monitoring a signal on a conductive via are described. An example apparatus includes: a controller, a first conductive via, a second conductive via and an evaluation circuit. The controller provides a clock signal as a first signal. The first conductive via provides a second signal responsive to the first signal. The second conductive via provides a third signal responsive to the second signal. Responsive to the third signal, the evaluation circuit provides an evaluation result signal. The evaluation result signal is indicative of a frequency of the clock signal, based on a delay of the third signal relative to the clock signal. The first conductive via, the second conductive via and the evaluation circuit may be included in an interface die. The evaluation circuit may detect whether a frequency of the first signal is below a first threshold frequency and may further provide the evaluation result signal.
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