Invention Grant
- Patent Title: Systems and methods for sample inspection and review
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Application No.: US13779062Application Date: 2013-02-27
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Publication No.: US09939386B2Publication Date: 2018-04-10
- Inventor: Isabella T. Lewis , Yakov Bobrov
- Applicant: KLA-Tencor Corporation
- Applicant Address: US CA Milpitas
- Assignee: KLA—Tencor Corporation
- Current Assignee: KLA—Tencor Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Suiter Swantz pc llo
- Main IPC: G01N21/88
- IPC: G01N21/88 ; G01N21/95

Abstract:
The disclosure is directed to systems and methods for sample inspection and review. In some embodiments, images are collected and/or defects are located utilizing separately addressable red, green, and blue (RGB) illumination sources to improve image quality. In some embodiments, illumination sources are pulse width modulated for substantially consistent light intensity in presence of variable sample motion. In some embodiments, a stage assembly is configured to support the sample without blocking access to the supported surface of the sample, and further configured to reduce oscillations or vibrations of the sample. In some embodiments, an illumination system includes an imaging path and a focusing path to allow full field of view focusing.
Public/Granted literature
- US20130271596A1 Systems and Methods for Sample Inspection and Review Public/Granted day:2013-10-17
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