Invention Grant
- Patent Title: Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testing
-
Application No.: US15430170Application Date: 2017-02-10
-
Publication No.: US09953727B1Publication Date: 2018-04-24
- Inventor: John A. Fifield , Eric D. Hunt-Schroeder , Darren L. Anand
- Applicant: GLOBALFOUNDRIES INC.
- Applicant Address: KY Grand Cayman
- Assignee: GLOBALFOUNDRIES INC.
- Current Assignee: GLOBALFOUNDRIES INC.
- Current Assignee Address: KY Grand Cayman
- Agency: Roberts Mlotkowski Safran Cole & Calderon, P.C.
- Agent Anthony Canale; Andrew Calderon
- Main IPC: G11C7/00
- IPC: G11C7/00 ; G11C29/00 ; G11C17/18 ; G11C17/16

Abstract:
The present disclosure relates to a structure which includes a twin-cell memory which is configured to program a plurality of write operations, a current sense amplifier which is connected to the twin-cell memory and is configured to sense a current differential and latch a differential voltage based on the current differential, and at least one current source which is connected to the current sense amplifier and is configured to add an offset current to the current sense amplifier to create the differential voltage.
Information query