- Patent Title: Method and apparatus for improving read margin for an SRAM bit-cell
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Application No.: US14137879Application Date: 2013-12-20
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Publication No.: US09953986B2Publication Date: 2018-04-24
- Inventor: Yih Wang
- Applicant: INTEL CORPORATION
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Schwabe, Williamson & Wyatt, P.C.
- Main IPC: H01L21/70
- IPC: H01L21/70 ; H01L27/11 ; G11C11/419

Abstract:
Described is a 6T SRAM cell which comprises: a first n-type transistor with a gate terminal coupled to word-line, source/drain terminal coupled to a first bit-line and drain/source terminal coupled to a first node; and a second n-type transistor with a source terminal coupled to a first supply node, a drain terminal coupled to the first node, and a gate terminal for coupling to multiple terminals, wherein the gate terminal includes a capacitor to increase coupling capacitance of the second n-type transistor. Described is a method which comprises: forming a metal gate in a first direction; forming a first spacer in the first direction on one side of the metal gate, the first spacer having a first dimension; and forming a second spacer in the first direction on another side of the metal gate, the second spacer having a second dimension which is substantially different from the first dimension.
Public/Granted literature
- US20150179653A1 METHOD AND APPARATUS FOR IMPROVING READ MARGIN FOR AN SRAM BIT-CELL Public/Granted day:2015-06-25
Information query
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