- 专利标题: Compensating for variations in selector threshold voltages
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申请号: US15291711申请日: 2016-10-12
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公开(公告)号: US09966127B2公开(公告)日: 2018-05-08
- 发明人: Ferdinando Bedeschi , Umberto Di Vincenzo
- 申请人: Micron Technology, Inc.
- 申请人地址: US ID Boise
- 专利权人: MICRON TECHNOLOGY, INC.
- 当前专利权人: MICRON TECHNOLOGY, INC.
- 当前专利权人地址: US ID Boise
- 代理机构: Holland & Hart LLP
- 主分类号: G11C11/22
- IPC分类号: G11C11/22
摘要:
Methods, systems, and devices are described for operating a memory array. A first voltage may be applied to a memory cell to activate a selection component of the memory cell prior to applying a second voltage to the memory cell. The second voltage may be applied to facilitate a sensing operation once the selection component is activated. The first voltage may be applied during a first portion of an access operation and may be used in determining a threshold voltage of the selection component. The subsequently applied second voltage may be applied during a second portion of the access operation and may have a magnitude associated with a preferred voltage for accessing a ferroelectric capacitor of the memory cell. In some cases, the second voltage has a greater rate of increase over time (e.g., a greater “ramp”) than the first voltage.
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