再颁专利
- 专利标题: Measuring system
- 专利标题(中): 测量系统
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申请号: US532347申请日: 1983-09-15
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公开(公告)号: USRE31774E公开(公告)日: 1984-12-18
- 发明人: David L. Fletcher , Walter O. Stadlin
- 申请人: David L. Fletcher , Walter O. Stadlin
- 申请人地址: PA North Wales
- 专利权人: Leeds & Northrup Company
- 当前专利权人: Leeds & Northrup Company
- 当前专利权人地址: PA North Wales
- 主分类号: G01R19/02
- IPC分类号: G01R19/02 ; G01R21/133
摘要:
There is provided a method for measuring a parameter whose value is calculable as an integral with time of a function of at least one variable so as to make possible the use of a microprocessor when measurements of such variables are desired. The variable is sampled periodically at a frequency asynchronous with the wave form which the variable follows and then there is periodically calculated the value of the function by summing the values for the function determined by the samples taken during the time between the calculations, thus determining the desired integral.
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