Measuring system
    1.
    再颁专利
    Measuring system 失效
    测量系统

    公开(公告)号:USRE31774E

    公开(公告)日:1984-12-18

    申请号:US532347

    申请日:1983-09-15

    IPC分类号: G01R19/02 G01R21/133

    CPC分类号: G01R19/02 G01R21/133

    摘要: There is provided a method for measuring a parameter whose value is calculable as an integral with time of a function of at least one variable so as to make possible the use of a microprocessor when measurements of such variables are desired. The variable is sampled periodically at a frequency asynchronous with the wave form which the variable follows and then there is periodically calculated the value of the function by summing the values for the function determined by the samples taken during the time between the calculations, thus determining the desired integral.

    Measuring system
    2.
    发明授权
    Measuring system 失效
    测量系统

    公开(公告)号:US4240149A

    公开(公告)日:1980-12-16

    申请号:US12632

    申请日:1979-02-16

    CPC分类号: G01R19/02 G01R21/133

    摘要: There is provided a method for measuring a parameter whose value is calculable as an integral with time of a function of at least one variable so as to make possible the use of a microprocessor when measurements of such variables are desired. The variable is sampled periodically at a frequency asynchronous with the wave form which the variable follows and then there is periodically calculated the value of the function by summing the values for the function determined by the samples taken during the time between the calculations, thus determining the desired integral.

    摘要翻译: 提供了一种用于测量其值可计算为与至少一个变量的函数的时间积分的参数的方法,以便在需要这些变量的测量时使微处理器成为可能。 该周期性地以与变量所遵循的波形异步的频率周期性地对变量进行采样,然后通过对由在计算之间的时间内采集的样本确定的函数的值进行求和来周期性地计算函数的值,从而确定 所需积分。