再颁专利
USRE36892E Orthogonal ion sampling for electrospray .[.LC/MS.]. mass spectrometry
失效
电喷雾正交离子采样[LC / MS]质谱
- 专利标题： Orthogonal ion sampling for electrospray .[.LC/MS.]. mass spectrometry
- 专利标题（中）： 电喷雾正交离子采样[LC / MS]质谱
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申请号： US792303申请日： 1997-01-31
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公开(公告)号： USRE36892E公开(公告)日： 2000-10-03
- 发明人: James A. Apffel, Jr. , Mark H. Werlich , James L. Bertsch , Paul C. Goodley , Kent D. Henry
- 申请人： James A. Apffel, Jr. , Mark H. Werlich , James L. Bertsch , Paul C. Goodley , Kent D. Henry
- 申请人地址： CA Palo Alto
- 专利权人： Agilent Technologies
- 当前专利权人： Agilent Technologies
- 当前专利权人地址： CA Palo Alto
- 主分类号： G01N27/62
- IPC分类号： G01N27/62 ; G01N30/72 ; H01J49/04 ; B01D59/46 ; H01J49/00
摘要：
.[.The invention teaches the uses of a plurality of electric fields and of orthogonal spray configurations of vaporized analyte which combine so as to operate to enhance the efficiency of analyte detection and mass analysis with a mass spectrometer by reducing vapor in the vacuum system and concomitant noise. Several embodiments of the invention are described for purposes of illustration..]. .Iadd.The invention relates to a method and apparatus for improving signal relative to noise without loss of ion collection efficiency in electrospray mass spectrometry, including liquid chromatography/mass spectrometry..Iaddend.