Invention Application
WO2005122706A3 METHOD OF ALIGNING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR STRUCTURE THEREOF
审中-公开
对半导体器件进行校准的方法及其半导体结构
- Patent Title: METHOD OF ALIGNING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR STRUCTURE THEREOF
- Patent Title (中): 对半导体器件进行校准的方法及其半导体结构
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Application No.: PCT/KR2005000853Application Date: 2005-03-24
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Publication No.: WO2005122706A3Publication Date: 2006-08-17
- Inventor: KANG JOON-MO
- Applicant: KANG JOON-MO
- Assignee: KANG JOON-MO
- Current Assignee: KANG JOON-MO
- Priority: KR20040038878 2004-05-31; KR20050000019 2005-01-03
- Main IPC: H01L21/027
- IPC: H01L21/027 ; H01L21/58 ; H01L21/60 ; H01L21/607 ; H01L21/98 ; H01L23/544 ; H01L25/065
Abstract:
The invention relates to a method of aligning semiconductor devices in die stacking and a semiconductor structure fabricated by the method. In stacking a die on a wafer, for example, a first semiconductor device on the wafer and a second semiconductor device on the die are aligned by a magnetic force between at least a first magnetic body belonging to the wafer and at least a second magnetic body belonging to the die. After the alignment, the die is made not to move by the magnetic force between the magnetic bodies to maintain the alignment which is necessary for the fabrication of a semiconductor structure.
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