Invention Application
- Patent Title: CLUSTER TOOL ARCHITECTURE FOR PROCESSING A SUBSTRATE
- Patent Title (中): 集群工具架构处理基板
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Application No.: PCT/US2005/046877Application Date: 2005-12-21
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Publication No.: WO2006069341A2Publication Date: 2006-06-29
- Inventor: ISHIKAWA, Tetsuya , ROBERTS, Rick, J. , ARMER, Helen, R. , VOLFOVSKI, Leon , PINSON, Jay, D. , RICE, Michael , QUACH, David, H. , SALEK, Mohsen, S. , LOWRANCE, Robert , BACKER, John, A. , WEAVER, William, Tyler , CARLSON, Charles , WANG, Chongyang , HUDGENS, Jeffrey , HERCHEN, Harald , LUE, Brian
- Applicant: APPLIED MATERIALS, INC. , ISHIKAWA, Tetsuya , ROBERTS, Rick, J. , ARMER, Helen, R. , VOLFOVSKI, Leon , PINSON, Jay, D. , RICE, Michael , QUACH, David, H. , SALEK, Mohsen, S. , LOWRANCE, Robert , BACKER, John, A. , WEAVER, William, Tyler , CARLSON, Charles , WANG, Chongyang , HUDGENS, Jeffrey , HERCHEN, Harald , LUE, Brian
- Applicant Address: 3050 Bowers Avenue, Santa Clara, CA 95054 US
- Assignee: APPLIED MATERIALS, INC.,ISHIKAWA, Tetsuya,ROBERTS, Rick, J.,ARMER, Helen, R.,VOLFOVSKI, Leon,PINSON, Jay, D.,RICE, Michael,QUACH, David, H.,SALEK, Mohsen, S.,LOWRANCE, Robert,BACKER, John, A.,WEAVER, William, Tyler,CARLSON, Charles,WANG, Chongyang,HUDGENS, Jeffrey,HERCHEN, Harald,LUE, Brian
- Current Assignee: APPLIED MATERIALS, INC.,ISHIKAWA, Tetsuya,ROBERTS, Rick, J.,ARMER, Helen, R.,VOLFOVSKI, Leon,PINSON, Jay, D.,RICE, Michael,QUACH, David, H.,SALEK, Mohsen, S.,LOWRANCE, Robert,BACKER, John, A.,WEAVER, William, Tyler,CARLSON, Charles,WANG, Chongyang,HUDGENS, Jeffrey,HERCHEN, Harald,LUE, Brian
- Current Assignee Address: 3050 Bowers Avenue, Santa Clara, CA 95054 US
- Agency: PATTERSON, B., Todd et al.
- Priority: US60/639,109 20041222; US11/112,281 20050422; US11/112,932 20050422
- Main IPC: H01L21/00
- IPC: H01L21/00
Abstract:
Embodiments generally provide an apparatus and method for processing substrates using a multi-chamber processing system (e.g., a cluster tool) that has an increased throughput, increased reliability, substrates processed in the cluster tool have a more repeatable wafer history, and also has a smaller system footprint. In one embodiment of the cluster tool, the cost of ownership is reduced by grouping substrates together and transferring and processing the substrates in groups of two or more to improve system throughput, and reduces the number of moves a robot has to make to transfer a batch of substrates between the processing chambers, thus reducing wear on the robot and increasing system reliability. Embodiments also provide for a method and apparatus that are used to increase the reliability of the substrate transfer process to reduce system down time.
Information query
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