Invention Application
- Patent Title: METHOD AND SYSTEM FOR MAGNETIC INDUCTION TOMOGRAPHY
- Patent Title (中): 用于磁感应造影的方法和系统
-
Application No.: PCT/IB2009053817Application Date: 2009-09-02
-
Publication No.: WO2010029465A3Publication Date: 2011-05-12
- Inventor: YAN MING , CHEN DAYU , JIN HUA
- Applicant: KONINKL PHILIPS ELECTRONICS NV , YAN MING , CHEN DAYU , JIN HUA
- Assignee: KONINKL PHILIPS ELECTRONICS NV,YAN MING,CHEN DAYU,JIN HUA
- Current Assignee: KONINKL PHILIPS ELECTRONICS NV,YAN MING,CHEN DAYU,JIN HUA
- Priority: CN200810215357 2008-09-11
- Main IPC: G01V3/10
- IPC: G01V3/10
Abstract:
The invention relates to a method and a system for magnetic induction tomography, the system comprising: at least one transmitting coil (312, 314) for generating a primary magnetic field to be applied to the object of interest (301); and at least one measurement coil arrangement (315, 317) for measuring electric signals induced by a secondary magnetic field which is generated by the object of interest in response to the primary magnetic field, wherein the at least one measurement coil arrangement comprises a plurality of measurement coils which are positioned in substantially the same plane. By using a plurality of independent measurement coils positioned in a plane so as to replace a conventional single measurement coil, the measurement coil across which the measured difference voltage is most sensitive to a change of the secondary magnetic field can be selected for calculating the change of conductivity distribution, resulting in an improved sensitivity of a MIT system.
Information query