Invention Application
WO2012106720A1 HIGH DENSITY METAL-INSULATOR-METAL TRENCH CAPACITOR WITH CONCAVE SURFACES
审中-公开
高密度金属绝缘体 - 金属电镀电容器
- Patent Title: HIGH DENSITY METAL-INSULATOR-METAL TRENCH CAPACITOR WITH CONCAVE SURFACES
- Patent Title (中): 高密度金属绝缘体 - 金属电镀电容器
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Application No.: PCT/US2012/023999Application Date: 2012-02-06
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Publication No.: WO2012106720A1Publication Date: 2012-08-09
- Inventor: LAN, Je-Hsiung , NOWAK, Matthew, Michael , GOUSEV, Evgeni, P. , KIM, Jonghae , CHUI, Clarence
- Applicant: QUALCOMM INCORPORATED , LAN, Je-Hsiung , NOWAK, Matthew, Michael , GOUSEV, Evgeni, P. , KIM, Jonghae , CHUI, Clarence
- Applicant Address: Attn: International Ip Administration 5775 Morehouse Drive San Diego, California 92121 US
- Assignee: QUALCOMM INCORPORATED,LAN, Je-Hsiung,NOWAK, Matthew, Michael,GOUSEV, Evgeni, P.,KIM, Jonghae,CHUI, Clarence
- Current Assignee: QUALCOMM INCORPORATED,LAN, Je-Hsiung,NOWAK, Matthew, Michael,GOUSEV, Evgeni, P.,KIM, Jonghae,CHUI, Clarence
- Current Assignee Address: Attn: International Ip Administration 5775 Morehouse Drive San Diego, California 92121 US
- Agency: GALLARDO, Michelle, S.
- Priority: US13/021,151 20110204
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L29/94 ; H01G4/012 ; H01L23/522 ; H01L23/64
Abstract:
Higher capacitance density is achieved by increasing a surface area of a capacitor. A larger surface area may be obtained by forming isotropic ball shapes (a concave surface) in the trenches on the semiconductor die. The concave surfaces are fabricated by depositing bilayers of amorphous-silicon and silicon oxide. Openings are patterned in the silicon oxide hard mask for trenches. The openings are transferred to the amorphous-silicon layers through isotropic etching to form concave surfaces. Conducting, insulating, and conducting layers are deposited on the concave surfaces of the trenches by atomic layer deposition.
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