Invention Application
- Patent Title: ATOMIC LAYER DEPOSITION USING RADICALS OF GAS MIXTURE
- Patent Title (中): 用气体混合物自由基沉积原子层沉积
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Application No.: PCT/US2012025095Application Date: 2012-02-14
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Publication No.: WO2012112584A2Publication Date: 2012-08-23
- Inventor: LEE SANG IN
- Applicant: SYNOS TECHNOLOGY INC , LEE SANG IN
- Assignee: SYNOS TECHNOLOGY INC,LEE SANG IN
- Current Assignee: SYNOS TECHNOLOGY INC,LEE SANG IN
- Priority: US201161443556 2011-02-16
- Main IPC: C23C16/455
- IPC: C23C16/455 ; C23C16/50
Abstract:
Performing atomic layer deposition (ALD) using radicals of a mixture of nitrogen compounds to increase the deposition rate of a layer deposited on a substrate. A mixture of nitrogen compound gases is injected into a radical reactor. Plasma of the compound gas is generated by applying voltage across two electrodes in the radical reactor to generate radicals of the nitrogen compound gases. The radicals are injected onto the surface of a substrate previously injected with source precursor. The radicals function as a reactant precursor and deposit a layer of material on the substrate.
Information query
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