Invention Application
WO2013173771A1 INTEGRATED START-UP BIAS BOOST FOR DYNAMIC ERROR VECTOR MAGNITUDE ENHANCEMENT
审中-公开
用于动态错误矢量增强的集成启动偏移
- Patent Title: INTEGRATED START-UP BIAS BOOST FOR DYNAMIC ERROR VECTOR MAGNITUDE ENHANCEMENT
- Patent Title (中): 用于动态错误矢量增强的集成启动偏移
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Application No.: PCT/US2013/041671Application Date: 2013-05-17
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Publication No.: WO2013173771A1Publication Date: 2013-11-21
- Inventor: HERSHBERGER, Kyle , EPLETT, Brian , SANTINI, Mark
- Applicant: MICROSEMI CORPORATION
- Applicant Address: One Enterprise Drive Aliso Viejo, CA 92656 US
- Assignee: MICROSEMI CORPORATION
- Current Assignee: MICROSEMI CORPORATION
- Current Assignee Address: One Enterprise Drive Aliso Viejo, CA 92656 US
- Agency: JOHNSTON, Holly, L. et al.
- Priority: US61/648,504 20120517
- Main IPC: H03F1/30
- IPC: H03F1/30 ; H03F1/02 ; H03F3/19
Abstract:
Devices and methods for correcting for start-up transients in integrated power amplifiers are disclosed. A delay element (116) is arranged to produce a delay waveform signal that is responsive to an input voltage signal. A transconductance element (118) has an input that receives the delay waveform signal and is arranged to provide an output boost current (102) that is based on the delay waveform signal and a gain of the transconductance element. A reference element (104) provides an output bias current (108) that is responsive to a static reference current (106) and the boost current (102). A bias element (110) has an input that receives the bias current (108) and is arranged to provide a bias control output (112). A power amplifier (114) is responsive to the bias control output (112) and is arranged to provide an amplified power output (RF OUT ).
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