Systems and methods for characterizing one or more properties of a material are disclosed. In some embodiments, the one or more properties include one or more thermal properties of the material, one or more thermoelectric properties of the material, such as the Seebeck or Peltier coefficient, and/or one or more thermomagnetic properties of the material, such as the Lorenz number. In some embodiments, a method of characterizing one or more properties of a sample material (20) comprises heating the sample material (20) and, while heating the sample material, obtaining one or more temperature measurements for at least one surface (18, 24) of the sample material via one or more thermoreflectance probes (30) and obtaining one or more electric measurements for the sample material that correspond in time to the one or more temperature measurements. The method further comprises computing one or more parameters that characterize one or more properties of the sample material based on the measurements.