Invention Application
WO2015109157A1 FINE PITCH BVA USING RECONSTITUTED WAFER FOR AREA ARRAY AT THE TOP FOR TESTING 审中-公开
使用重新计算的WAFER面板区域进行精细测量BVA

FINE PITCH BVA USING RECONSTITUTED WAFER FOR AREA ARRAY AT THE TOP FOR TESTING
Abstract:
A method for simultaneously making a plurality of microelectronic packages by forming an electrically conductive redistribution structure along with a plurality of microelectronic element attachment regions on a carrier. The attachment regions being spaced apart from one another and overlying the carrier. The method also including the formation of conductive connector elements between adjacent attachment regions. Each connector element having the first or second end adjacent the carrier and the remaining end at a height of the microelectronic element. The method also includes forming an encapsulation over portions of the connector elements and subsequently singulating the assembly, into microelectronic units, each including a microelectronic element. The surface of the microelectronic unit, opposite the redistribution structure, having both the active face of the microelectronic element and the free ends of the connector elements so that both are available for connection with a component external to the microelectronic unit.
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