Invention Application
- Patent Title: METHOD AND APPARATUS FOR IMAGE ANALYSIS
- Patent Title (中): 图像分析的方法和装置
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Application No.: PCT/EP2015/076540Application Date: 2015-11-13
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Publication No.: WO2016091534A1Publication Date: 2016-06-16
- Inventor: MIDDLEBROOKS, Scott, Anderson , VAN KRAAIJ, Markus, Gerardus, Martinus, Maria , KOOPMAN, Adrianus, Cornelis, Matheus , HUNSCHE, Stefan , COENE, Willem, Marie, Julia, Marcel
- Applicant: ASML NETHERLANDS B.V.
- Applicant Address: P.O. Box 324 5500 AH Veldhoven NL
- Assignee: ASML NETHERLANDS B.V.
- Current Assignee: ASML NETHERLANDS B.V.
- Current Assignee Address: P.O. Box 324 5500 AH Veldhoven NL
- Agency: PETERS, John
- Priority: US62/089,692 20141209
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G03F7/20
Abstract:
A method and apparatus of detection, registration and quantification of an image is described. The method may include obtaining an image of a lithographically created structure, and applying a level set method to an object, representing the structure, of the image to create a mathematical representation of the structure. The method may include obtaining a first dataset representative of a reference image object of a structure at a nominal condition of a parameter, and obtaining second dataset representative of a template image object of the structure at a non- nominal condition of the parameter. The method may further include obtaining a deformation field representative of changes between the first dataset and the second dataset. The deformation field may be generated by transforming the second dataset to project the template image object onto the reference image object. A dependence relationship between the deformation field and change in the parameter may be obtained.
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