Invention Application
- Patent Title: SYSTEMS AND METHODS FOR DETECTING THERMAL RUNAWAY
- Patent Title (中): 用于检测热阻的系统和方法
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Application No.: PCT/US2015/065535Application Date: 2015-12-14
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Publication No.: WO2016118250A1Publication Date: 2016-07-28
- Inventor: SAEIDI, Mehdi , MITTAL, Rajat , MITTAL, Arpit , COUTTS, Ryan Michael
- Applicant: QUALCOMM INCORPORATED
- Applicant Address: Attn: International IP Administration 5775 Morehouse Drive San Diego, California 92121-1714 US
- Assignee: QUALCOMM INCORPORATED
- Current Assignee: QUALCOMM INCORPORATED
- Current Assignee Address: Attn: International IP Administration 5775 Morehouse Drive San Diego, California 92121-1714 US
- Agency: WORLEY, Eugene R. et al.
- Priority: US14/603,058 20150122
- Main IPC: G05D23/19
- IPC: G05D23/19 ; G06F1/20 ; G01K3/08 ; G01K7/42
Abstract:
In one embodiment, a method of temperature control comprises receiving temperature readings from a temperature sensor on a chip, calculating one or more second derivatives of temperature with respect to time based on the temperature readings, and determining whether to perform temperature mitigation on the chip based on the one or more calculated second derivatives of temperature.
Information query
