Invention Application
- Patent Title: SYSTEM AND METHOD FOR TRACE-LEVEL ANALYSIS OF CHEMICAL COMPOUNDS
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Application No.: PCT/US2021/039986Application Date: 2021-06-30
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Publication No.: WO2022006335A1Publication Date: 2022-01-06
- Inventor: CARDIN, Daniel B.
- Applicant: ENTECH INSTRUMENTS INC.
- Applicant Address: 2207 Agate Ct.
- Assignee: ENTECH INSTRUMENTS INC.
- Current Assignee: ENTECH INSTRUMENTS INC.
- Current Assignee Address: 2207 Agate Ct.
- Agency: STEVENS, Sarah H. et al.
- Priority: US63/046,454 2020-06-30
- Main IPC: G01N30/16
- IPC: G01N30/16 ; G01N30/06 ; G01N30/88 ; G01N30/08 ; G01N30/20 ; H01J49/04 ; G01N30/12 ; G01N2030/025 ; G01N2030/067 ; G01N2030/085 ; G01N2030/128 ; G01N2030/143 ; G01N2030/884 ; G01N30/14
Abstract:
Techniques disclosed herein can be used to perform a rapid, splitless injection of a sample including SVOCs and VOCs. In some embodiments, a system includes two focusing traps combined in series, one inside of a GC oven and one in a separate oven to concentrate the SVOCs inside of the GC oven and concentrate the VOCs outside of the GC oven. Heating the VOC focusing trap and reversing the flow through both focusers allows splitless injection of compounds boiling from as low as -100 ⁰C to as high as 600 ⁰C in a single analysis, with a narrow injection bandwidth to optimize both sensitivity and the resolving power of the analyzer.
Information query