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    SCATTERING MICROSCOPY
    7.
    发明公开
    SCATTERING MICROSCOPY 审中-公开

    公开(公告)号：EP4276510A2

    公开(公告)日：2023-11-15

    申请号：EP23188175.6

    申请日：2020-03-12

    申请人： Oxford University Innovation Limited

    发明人： KUKURA, Philipp ,  FAEZ, Sanli

    IPC分类号： G02B21/06

    摘要： A method of monitoring and controlling the binding rate of a particle is provided. The method comprising the steps of; imaging an object having a surface and at least one particle with a scattering microscope including a light source arranged to emit illuminating light and a light detector, the microscope further arranged to illuminate the object with the illuminating light and to detect light elastically scattered from the object with the light detector; and applying an electrical potential to the surface of the object to change the electrochemical state of the surface; wherein the change of the electrochemical state permits monitoring and controlling of the rate of binding of the particle to the surface.