摘要:
A method for producing a cerium oxide, characterized as comprising heating a cerium salt at a high speed up to a burning temperature, followed by burning; a cerium oxide abrasive comprising a cerium oxide produced by the method and pure water; an abrasive containing a slurry comprising a medium and, dispersed therein, cerium oxide particles having, in a powder X-ray diffraction chart, an intensity ratio of the area of a primary peak appearing at 27 to 30° to that of a secondary peak appearing at 32 to 35° (primary peak/secondary peak) of 3.20 or more; an abrasive containing a slurry comprising a medium and, dispersed therein, cerium oxide particles having a bulk density of 6.5 g/cm3 or less; an abrasive containing a slurry comprising a medium and, dispersed therein, abrasive grains having pores; a method for polishing a substrate, characterized as comprising polishing a specific substrate using the above abrasive; and a method for manufacturing a semiconductor device, characterized as comprising a step of polishing with the above abrasive.
摘要:
The present invention relates to a CMP polishing slurry comprising cerium oxide particles, a dispersant, a water-soluble polymer and water, wherein the water-soluble polymer is a polymer obtained in polymerization of a monomer containing at least one of a carboxylic acid having an unsaturated double bond and the salt thereof by using at least one of a cationic azo compound and the salt thereof as a polymerization initiator. The present invention provides a polishing slurry and a polishing method allowing polishing efficiently uniformly at high speed without scratch and also allowing easy process management in the CMP technology of smoothening an interlayer dielectric film, BPSG film, and insulation film for shallow trench isolation.