公开(公告)号：EP3634233A1

公开(公告)日：2020-04-15

申请号：EP18722599.0

申请日：2018-05-14

申请人： Koninklijke Philips N.V. ,  Paul Scherrer Institut

发明人： KOEHLER, Thomas ,  ROESSL, Ewald ,  BARTELS, Matthias ,  WANG, Zhentian ,  STAMPANONI, Marco

IPC分类号： A61B6/00

公开(公告)号：EP3403581A1

公开(公告)日：2018-11-21

申请号：EP17171111.2

申请日：2017-05-15

申请人： Koninklijke Philips N.V. ,  Paul Scherrer Institut

发明人： KOEHLER, Thomas ,  ROESSL, Ewald ,  BARTELS, Matthias

IPC分类号： A61B6/00

CPC分类号： A61B6/484 ,  A61B6/4291 ,  A61B6/502 ,  G21K2201/064

摘要： A mounting structure (MS) for interferometric imaging and an interferometric imaging apparatus comprising same. The mounting structure comprises at least one curved surface (S d ) for receiving an interferometric grating (Gi) to rest thereon, the surface (Sd) having a plurality of apertures (SL), the grating (Gi) when so received, covering at least one of said apertures.

公开(公告)号：EP3830606A1

公开(公告)日：2021-06-09

申请号：EP19745171.9

申请日：2019-08-01

申请人： Koninklijke Philips N.V.

发明人： STEADMAN BOOKER, Roger ,  ROESSL, Ewald

IPC分类号： G01T1/24

公开(公告)号：EP3558126B1

公开(公告)日：2020-10-07

申请号：EP18759295.1

申请日：2018-08-22

申请人： Koninklijke Philips N.V.

发明人： ROESSL, Ewald

IPC分类号： A61B6/00 ,  G01N23/20 ,  G02B7/00 ,  G02B5/18 ,  G02B26/08 ,  G02B27/52 ,  G21K1/04 ,  G21K1/06

公开(公告)号：EP3551077A1

公开(公告)日：2019-10-16

申请号：EP17811940.0

申请日：2017-12-07

申请人： Koninklijke Philips N.V.

发明人： ROESSL, Ewald ,  KOEHLER, Thomas

IPC分类号： A61B6/03 ,  A61B6/04 ,  A61B6/00

公开(公告)号：EP3494415A1

公开(公告)日：2019-06-12

申请号：EP18750229.9

申请日：2018-08-13

申请人： Koninklijke Philips N.V.

发明人： STEADMAN BOOKER, Roger ,  ROESSL, Ewald ,  RUETTEN, Walter

IPC分类号： G01T1/20

公开(公告)号：EP3472804A1

公开(公告)日：2019-04-24

申请号：EP17735014.7

申请日：2017-06-14

申请人： Koninklijke Philips N.V.

发明人： SCHÄFER, Dirk ,  DAERR, Heiner ,  KOEHLER, Thomas ,  ROESSL, Ewald

IPC分类号： G06T7/00 ,  G06T11/00

公开(公告)号：EP3465276A1

公开(公告)日：2019-04-10

申请号：EP17727268.9

申请日：2017-06-07

申请人： Koninklijke Philips N.V.

发明人： ROESSL, Ewald ,  STEADMAN BOOKER, Roger

IPC分类号： G01T1/17 ,  G01T1/24

公开(公告)号：EP3170148B1

公开(公告)日：2018-10-31

申请号：EP15738349.8

申请日：2015-07-16

申请人： Koninklijke Philips N.V.

发明人： ROESSL, Ewald ,  KOEHLER, Thomas

IPC分类号： G06T11/00

CPC分类号： G06T11/008 ,  A61B6/032 ,  A61B6/484 ,  A61B6/5205 ,  G01N23/20075 ,  G06T11/006

摘要： A system and related method for X-ray phase contrast imaging. A signal model is fitted to interferometric measurment data. The fitting operation yields a Compton cross section and a photo-electric image. A pro-portionality between the Compton cross section and electron-density is used to achieve a reduction of the number of fitting variables. The Compton image may be taken, up to a constant, as a phase contrast images.

公开(公告)号：EP3378396A1

公开(公告)日：2018-09-26

申请号：EP17162475.2

申请日：2017-03-23

申请人： Koninklijke Philips N.V.

发明人： BARTELS, Matthias ,  KOEHLER, Thomas ,  ROESSL, Ewald

IPC分类号： A61B6/00

CPC分类号： A61B6/484 ,  A61B6/583

摘要： The invention is related to processing x-ray imaging data, specifically phase contrast x-ray imaging data, and addresses the problems associated, for example, with vibrations in grating-based differential phase contrast imaging by making use of spectral information. It was realized that one may make use of the spectral information in determining the vibration state of the Moire pattern based on multi-energy-bin x-ray detectors, the energy independence of vibration-induced Moire pattern phase shifts, the energy dependence of object-induced Moire pattern phase shifts and a phantom designed to allow for measuring the dependence of the object-induced phase shift as a function of the energy bin. In particular, it was found that by suitable data processing the vibration-induced shifts and the like can be disentangled from the object properties and hence vibration artifacts in the image are reduced, while there is no particular need for changing the basic physical structure of the imaging device.