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    Method and system to measure and represent the measured value of a limit in terms of another measurement in a signal measurement system
    2.
    发明公开
    Method and system to measure and represent the measured value of a limit in terms of another measurement in a signal measurement system 有权
    用于测量和表示信号测量系统中另一测量值的测量值的方法和系统

    公开(公告)号：EP2256509A3

    公开(公告)日：2010-12-15

    申请号：EP10250930.4

    申请日：2010-05-14

    Applicant: Tektronix, Inc.

    Inventor： Anuradha, V. ,  Guenther, Mark L. ,  Ajgaonkar, Manisha ,  Sri, Krishna N.H.

    IPC: G01R31/317 ,  G11C29/50

    CPC classification number: G01R31/317 ,  G01R13/02

    Abstract: Embodiments of the invention provide a system and method to measure and represent the measured value of a limit in terms of another measurement, such as clock values or cycles of the system. The system can include, for example, a test and measurement instrument such as an oscilloscope. In another embodiment of the present invention, slew rate de-rated values may be automatically determined through the use of configurable lookup tables.

    Abstract translation: 本发明的实施例提供了一种系统和方法，用于根据另一测量来测量和表示测量值，例如系统的时钟值或周期。 该系统可以包括例如测试和测量仪器，例如示波器。 在本发明的另一个实施例中，可以通过使用可配置的查找表来自动确定压摆率降低值。

    Pattern identification and bit level measurements on repetitive patterns
    5.
    发明公开
    Pattern identification and bit level measurements on repetitive patterns 有权
    Signalmustererkennung und Bitniveaumessungen a sich wiederholenden Signalmustern

    公开(公告)号：EP1643258A1

    公开(公告)日：2006-04-05

    申请号：EP05255893.9

    申请日：2005-09-22

    Applicant: Tektronix, Inc.

    Inventor： Kayal, Saumitra ,  Ajgaonkar, Manisha

    IPC: G01R31/3193 ,  G01R31/319 ,  H04L1/20 ,  H04L7/02

    CPC classification number: H04L1/24 ,  G01R31/31711 ,  G01R31/319 ,  G01R31/31903 ,  G01R31/31937

    Abstract: A method of pattern identification and bit level measurements for a high speed digital signal using an oscilloscope converts an input waveform into a bit stream sequence. From the bit stream sequence pre-defined patterns are identified and overlaid on each other to form a superimposed pattern. A center region for each bit of the superimposed pattern is identified, and appropriate voltage measurements within the respective center regions are taken for the bit levels.

    Abstract translation: 使用示波器的高速数字信号的模式识别和位电平测量的方法将输入波形转换为位流序列。 从比特流序列中，预定义的图案被识别并彼此重叠以形成叠加图案。 识别叠加图案的每个位的中心区域，并且针对位电平采取相应中心区域内的适当电压测量。

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