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公开(公告)号:EP4405656A1
公开(公告)日:2024-07-31
申请号:EP22792989.0
申请日:2022-09-23
发明人: COON, Joshua Jacques , WESTPHALL, Michael Scott , LEE, Kenneth , SALOME, Austin , GRANT, Timothy , LODGE, Jean
CPC分类号: G01N1/36 , G01N1/42 , G01N1/4022 , G01N1/2813 , G01N2001/402720130101
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公开(公告)号:EP4399500A2
公开(公告)日:2024-07-17
申请号:EP22868097.1
申请日:2022-09-09
发明人: OLINER, Jonathan Daniel , COX-MURANAMI, Wesley Akira , TRUONG, Thieu Q. , FAIRBANKS, Jonathan W. , TAT, Allen , FISCHER, Ryan E. , BALTES, Christian R. , BAKKEN, Todd J.
CPC分类号: G01N1/06 , G01N2001/06320130101
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公开(公告)号:EP4394080A2
公开(公告)日:2024-07-03
申请号:EP23219066.0
申请日:2023-12-21
申请人: FEI Company
IPC分类号: C23C16/48 , H01J37/317 , H01J37/26 , G01N1/42
CPC分类号: H01J37/26 , H01J37/3178 , H01J2237/00620130101 , H01J2237/3174920130101 , C23C16/486 , H01J2237/182520130101 , H01J2237/200120130101 , G01N1/42
摘要: Methods include arranging a substrate 102 in a vacuum chamber 108 of a charged particle beam microscope 100, wherein the substrate is held at a cryogenic temperature, and depositing on the substrate at the cryogenic temperature a condensate precursor 120 that is stored in a crucible 118, wherein the deposited condensate precursor forms a deposition layer 132 on the substrate.
An apparatus include a vacuum chamber configured to support a substrate, a condensate precursor system coupled to the vacuum chamber, wherein a vacuum pump is configured to draw a vacuum on a storage reservoir to reduce a vapor pressure build-up of a one or more volatile contaminants in the storage reservoir and thereby reduce a deposition of the one or more contaminants on the substrate during the condensing of the condensate precursor on the substrate. A condensate precursor can comprise a transition metal center comprising hafnium or osmium. Related deposition and cap layers are disclosed.-
公开(公告)号:EP4247257A1
公开(公告)日:2023-09-27
申请号:EP21895866.8
申请日:2021-11-17
申请人: Savr Pak Corporation
IPC分类号: A61B5/1486 , G01N1/22 , G01N33/497 , A61B5/087 , G01N1/42 , A61B5/00 , A61B5/08
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公开(公告)号:EP4209772A1
公开(公告)日:2023-07-12
申请号:EP21863091.1
申请日:2021-12-29
摘要: The present disclosure provides a frozen sample holder having an identification ring, and relates to the technical field of freezing sectioning-related equipment, the frozen sample holder having an identification ring comprising an identification ring structure and a frozen sample holder structure, wherein the identification ring structure is in connection with an outer wall of the frozen sample holder structure; and the identification ring structure includes an identification segment, which is configured to mark the information of a sample in the frozen sample holder structure. The present disclosure solves the technical problem existing in the operating process of freezing sectioning all along that multiple samples would easily be confused with each other due to the difficulty to mark frozen sample holders.
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公开(公告)号:EP4105632A1
公开(公告)日:2022-12-21
申请号:EP22178759.1
申请日:2022-06-13
申请人: Nanosoft, LLC
摘要: A method includes introducing a fluidic sample into the void volume and onto the surface of a porous material, bringing the porous material into contact with a hydrophilic substrate compatible with a cryogenic Transmission Electron Microscope, separating the porous material from the substrate, and transferring a portion of the sample from the porous material to the substrate between their contact and separation.
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公开(公告)号:EP4021180A1
公开(公告)日:2022-07-06
申请号:EP20857029.1
申请日:2020-08-25
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公开(公告)号:EP4001895A1
公开(公告)日:2022-05-25
申请号:EP21203295.7
申请日:2021-10-18
发明人: BALDWIN, Eli , FAZZIO, Mark P.
摘要: A particle concentration measurement system includes a first window and a second window in a housing. The first window and the second window respectively define a first end and a second end of an interaction region between the first window and the second window. The system also includes a particle-laden gas inlet through a wall of the housing between the first window and the second window. The particle-laden gas inlet introduces particle-laden gas from an environment that includes particles mixed with other materials into the interaction region. A first set of clean gas inlets through the wall of the housing are at different radial positions of the housing and at a first axial location of the housing, and a second set of clean gas inlets through the wall of the housing are at different radial positions of the housing and at a second axial location of the housing.
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