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公开(公告)号:EP3388868B1
公开(公告)日:2020-06-24
申请号:EP17204408.3
申请日:2017-11-29
Applicant: Nuctech Company Limited
Inventor: ZHAO, Ziran , GU, Jianping , YI, Qian , LIU, Bicheng
IPC: G01V5/00
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公开(公告)号:EP3187905B1
公开(公告)日:2019-10-30
申请号:EP16191987.3
申请日:2016-09-30
Applicant: Nuctech Company Limited
Inventor: CHEN, Zhiqiang , ZHAO, Ziran , LI, Yuanjing , WU, Wanlong , TANG, Le , RUAN, Ming
IPC: G01V5/00
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公开(公告)号:EP3553505A1
公开(公告)日:2019-10-16
申请号:EP17878824.6
申请日:2017-09-22
Applicant: Nuctech Company Limited , Tsinghua University
Inventor: LI, Yuanjing , ZHAO, Ziran , LI, Jianmin , LI, Yulan , ZHU, Weibin , ZOU, Xiang , ZHANG, Qingjun , ZONG, Chunguang , ZHAO, Xiaolin , LI, Shuwei , WANG, Junxiao
IPC: G01N23/04
Abstract: A radiation detection apparatus and method, and a data processing method and processors (103, 303, 505), relating to the technical field of radiation detection. The radiation detection apparatus comprises: a ray detector (101); a high-speed ADC (102, 302, 403, 500) connected to the ray detector (101); and a data processor (103, 303, 505) connected to the high-speed ADC (102, 302, 403, 500); the ray detector (101) converts an optical signal produced after X-ray transmission and the action of a scintillator into an electrical signal; the high-speed ADC (102, 302, 403, 500) acquires waveform data by means of electrical signal waveform sampling; on the basis of the waveform data, the data processor (103, 303, 505) determines the number of single photon signals, and then determines to use integrated signals and/or count signals for imaging. The apparatus can use the single photon detection capability of the detector (101) to determine the number of single photon signals on the basis of waveform data, and then determine to use waveform data integrated signals and/or count signals for imaging, thereby improving the radiation detection imaging quality of a detected object, and enhancing the penetration index and substance distinguishing capability of the system.
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94.
公开(公告)号:EP3101418B1
公开(公告)日:2019-10-02
申请号:EP15875162.8
申请日:2015-12-24
Applicant: Nuctech Company Limited
Inventor: ZHANG, Qingjun , LI, Yuanjing , CHEN, Zhiqiang , ZHAO, Ziran , LIU, Yinong , LIU, Yaohong , MA, Qiufeng , HE, Huishao , ZHU, Weiping , ZOU, Xiang , CHANG, Jianping , LIANG, Song
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公开(公告)号:EP3521783A1
公开(公告)日:2019-08-07
申请号:EP18248030.1
申请日:2018-12-27
Applicant: Nuctech Company Limited
Inventor: ZHAO, Ziran , HU, Haifan , MA, Xuming , WANG, Yingxin
Abstract: The present disclosure provides a terahertz detector. The terahertz detector includes a planar array structure that is constituted by a plurality of pixel units, the plurality of pixel units each comprise N sub pixels and each of the sub pixels comprises no more than one signal trigger configured to transform a terahertz signal to an electrical current pulsing signal, and each of the plurality of pixel units detects a signal that is a sum of the electrical current pulsing signals of the N sub pixels, where N is an integer greater than 1.
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公开(公告)号:EP3505971A1
公开(公告)日:2019-07-03
申请号:EP18214754.6
申请日:2018-12-20
Applicant: Nuctech Company Limited
Inventor: ZHAO, Bozhen , LI, Shuwei , ZOU, Xiang , WANG, Yi , ZHAO, Ziran , ZHU, Weibin , SUN, Lifeng , ZHANG, Qingjun
IPC: G01T7/00
Abstract: The present disclosure relates to a scintillator sensitivity measuring device and a measuring method. The scintillator sensitivity measuring device includes: a ray source (11) for emitting rays (13) to a radiation area (15); a driving mechanism (2) for causing multiple sets of scintillators (3) to be detected to successively enter the radiation area (15), and an image acquiring system (4) for acquiring scintillation illuminating images of the detected scintillators (3) which enter the radiation area (15), so that the sensitivity of the detected scintillators (3) is calculated on the basis of the scintillation illuminating images. The embodiments of the present disclosure are capable of quickly and efficiently implementing sensitivity measurement of a plurality of scintillators.
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公开(公告)号:EP3480776A1
公开(公告)日:2019-05-08
申请号:EP17861967.2
申请日:2017-07-31
Applicant: Nuctech Company Limited
Inventor: CHEN, Zhiqiang , ZHAO, Ziran , WU, Wanlong , JIN, Yingkang , DING, Xianli , LONG, Jiao , SHEN, Zongjun , LI, Zheng
Abstract: A security inspection system and a method of configuring a security inspection device are provided. In an embodiment, the security inspection system may include: an identity information entry device configured to enter an identification of an inspected person; a parameter determination device configured to determine a parameter for performing a security inspection on the inspected person based on a security factor of the inspected person determined according to user data corresponding to the identification of the inspected person; and a security inspection device configured to perform the security inspection on the inspected person based on the determined parameter. According to embodiments, it is possible to accurately predict the user's behavior and evaluate the risk or potential danger from the user by analyzing and mining the user's comprehensive data, and thus to provide a more accurate security inspection solution.
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公开(公告)号:EP3457425A1
公开(公告)日:2019-03-20
申请号:EP18191113.2
申请日:2018-08-28
Applicant: Nuctech Company Limited , Tsinghua University
Inventor: LIU, Yaohong , ZHAO, Ziran , LIU, Jinsheng , CHEN, Huaibi , ZHANG, Liang , ZHANG, Dongsheng
IPC: H01J35/12
Abstract: The disclosure provides an X-ray conversion target. The X-ray conversion target includes target body and a target part (5) disposed within the target body, the target part having a first face configured to produce X-rays; wherein, the X-ray conversion target further comprises a cooling passage (1) having a side wall, at least a part of the side wall being consisted of a portion of the target part.
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公开(公告)号:EP2963454B1
公开(公告)日:2019-03-06
申请号:EP15175267.2
申请日:2015-07-03
Applicant: Nuctech Company Limited
Inventor: CHEN, Zhiqiang , LI, Yuanjing , ZHAO, Ziran , WU, Wanlong , JIN, Yingkang , TANG, Le , XU, Chengcong , RUAN, Ming , DING, Guangwei
IPC: G01V5/00
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100.
公开(公告)号:EP3396405A1
公开(公告)日:2018-10-31
申请号:EP16877327.3
申请日:2016-08-19
Applicant: Nuctech Company Limited
Inventor: CHEN, Zhiqiang , ZHAO, Ziran , QIAO, Lingbo , WU, Wanlong , SHEN, Zongjun , WANG, Ziye
IPC: G01S13/89
CPC classification number: G01S13/89 , G01S13/887 , G01V8/005
Abstract: A millimeter wave three dimensional holographic scan imaging apparatus and a method for inspecting a human body or an article are disclosed. The apparatus includes: first millimeter wave transceiver module; a second millimeter wave transceiver module; a first guide rail device, to which the first millimeter wave transceiver module is connected in slidable form, such that the first millimeter wave transceiver module is moveable in a first scanning track along the first guide rail device to scan a first side and a second side of an object to be inspected; a second guide rail device, to which the second millimeter wave transceiver module is connected in slidable form, such that the second millimeter wave transceiver module is moveable in a second scanning track along the second guide rail device to scan a third side and a fourth side of the object, the third side of the object being opposite to the first side of the object and the fourth side of the object being opposite to the second side of the object; and a driver configured to drive the first millimeter wave transceiver module to move along the first guide rail device and to drive the second millimeter wave transceiver module to move along the second guide rail device.
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