Reducing scattering related features in terahertz time domain spectroscopy by using a diffuse irradiating beam
    23.
    发明公开
    Reducing scattering related features in terahertz time domain spectroscopy by using a diffuse irradiating beam 审中-公开
    通过使用漫射辐射减少在太赫时域光谱泄漏相关的影响

    公开(公告)号:EP2023124A2

    公开(公告)日:2009-02-11

    申请号:EP08014345.6

    申请日:2005-08-26

    申请人: Teraview Limited

    IPC分类号: G01N21/35

    摘要: A method of investigating an object, comprising the steps of:
    (a) irradiating the object with an optically-generated pulse of electromagnetic radiation, said pulse having a plurality of frequencies in the range from 100 GHz to 100 THz;
    (b) detecting radiation transmitted and/or reflected from a first point on or within the object to obtain a time domain waveform;

    wherein the irradiating pulse of radiation is focussed at a second point on or within the object.

    摘要翻译: 调查的方法为对象,其包括以下步骤:(a)用电磁辐射照射中的光学产生的脉冲的物体,其具有的频率在100 GHz至100赫兹的范围内的多个所述脉冲; (b)检测辐射反mitted和/或从上或对象,以获得时域波形内的第一点反射的光; worin辐射的照射脉冲在第二点被聚焦或对象内。

    AN IMAGING APPARATUS AND METHOD
    29.
    发明公开
    AN IMAGING APPARATUS AND METHOD 有权
    成像装置和方法

    公开(公告)号:EP1269156A1

    公开(公告)日:2003-01-02

    申请号:EP01907935.9

    申请日:2001-02-28

    申请人: Teraview Limited

    IPC分类号: G01N21/49 G01N21/35 G01N21/31

    CPC分类号: G01N21/4795 G01N21/3581

    摘要: An apparatus and method for imaging a sample, the apparatus comprising: a source for irradiating a sample with a beam of substantially continuous electromagnetic radiation having a frequency in the range 25GHz to 100THz; means for subdividing an area of the sample which is to be imaged into a two dimensional array of pixels; means for detecting radiation from each pixel wherein the detector is configured to detect a phase dependent quantity of the detected radiation which is measured relative to the radiation which irradiates the sample.

    摘要翻译: 一种用于对样本成像的设备和方法,该设备包括:用于用具有在25GHz到100THz范围内的频率的基本上连续的电磁辐射束照射样本的源; 用于将待成像的样本的区域细分成像素的二维阵列的装置; 用于检测来自每个像素的辐射的装置,其中所述检测器被配置为检测相对于照射样本的辐射测量的检测到的辐射的相位依赖量。