Pattern forming method and resist composition used therefor
    21.
    发明公开
    Pattern forming method and resist composition used therefor 有权
    一种用于形成结构和所述抗蚀剂组合物用于处理

    公开(公告)号:EP1770440A3

    公开(公告)日:2012-05-09

    申请号:EP06020399.9

    申请日:2006-09-28

    发明人: Tarutani, Shinji

    IPC分类号: G03F7/004 G03F7/039

    摘要: A pattern forming method comprising: coating a resist composition on a substrate; adjusting a rotational speed of the substrate within a range of 500 to 1,500 rpm so that a film thickness of the resist composition coated is adjusted; and subjecting the resist composition to drying, exposure and development, wherein the resist composition includes: (A) a compound capable of generating an acid upon irradiation with one of actinic rays and radiation; (B) a resin of which dissolution rate in an alkali developer increases under the action of an acid; (C) a mixed solvent; and (D) a surfactant, and the mixed solvent (C) includes at least one member selected from a group A of solvents and at least one member selected from a group B of solvents, or includes at least one member selected from the group A of solvents and at least one member selected from a group C of solvents: Group A: propylene glycol monoalkyl ether carboxylates, Group B: propylene glycol monoalkyl ethers, alkyl lactates, acetic acid esters, one of chain and cyclic ketones, and alkoxyalkyl propionates, and Group C: γ-butyrolactone, ethylene carbonate and propylene carbonate.

    Chemical amplification resist composition and pattern-forming method using the same
    22.
    发明公开
    Chemical amplification resist composition and pattern-forming method using the same 审中-公开
    化学放大型抗蚀剂组合物和方法,用于形成结构,使得

    公开(公告)号:EP2031445A3

    公开(公告)日:2009-05-13

    申请号:EP08016147.4

    申请日:2005-08-18

    IPC分类号: G03F7/004 G03F7/039

    摘要: The present invention relates to a chemical amplification resist composition comprising:
    (A) a resin increasing the solubility in an alkali developer by the action of an acid;
    (B) a compound capable of generating an acid upon irradiation with actinic ray or radiation;
    (C) a compound having a pKa value of 4-15 selected from formulae (FAD-II) and (FAD-III):

    wherein
    R a105 each individually is F or perfluoroalkyl;
    n is 1 or 2, and (n+m) = 6;
    R a106 each individually is F or perfluoroalkyl; and
    A a102 is a bond or a divalent organic group; and

    (D) a solvent.
    Also, the invention relates to a pattern-forming method comprising; forming a resist film with the above composition and exposing and developing the resist film

    Pattern forming method and resist composition used therefor
    23.
    发明公开
    Pattern forming method and resist composition used therefor 有权
    Verfahren zur Strukturformung und Resistzusammensetzungdafür

    公开(公告)号:EP1770440A2

    公开(公告)日:2007-04-04

    申请号:EP06020399.9

    申请日:2006-09-28

    发明人: Tarutani, Shinji

    IPC分类号: G03F7/004 G03F7/039

    摘要: A pattern forming method comprising: coating a resist composition on a substrate; adjusting a rotational speed of the substrate within a range of 500 to 1,500 rpm so that a film thickness of the resist composition coated is adjusted; and subjecting the resist composition to drying, exposure and development, wherein the resist composition includes: (A) a compound capable of generating an acid upon irradiation with one of actinic rays and radiation; (B) a resin of which dissolution rate in an alkali developer increases under the action of an acid; (C) a mixed solvent; and (D) a surfactant, and the mixed solvent (C) includes at least one member selected from a group A of solvents and at least one member selected from a group B of solvents, or includes at least one member selected from the group A of solvents and at least one member selected from a group C of solvents: Group A: propylene glycol monoalkyl ether carboxylates, Group B: propylene glycol monoalkyl ethers, alkyl lactates, acetic acid esters, one of chain and cyclic ketones, and alkoxyalkyl propionates, and Group C: γ-butyrolactone, ethylene carbonate and propylene carbonate.

    摘要翻译: 一种图案形成方法,包括:在基材上涂布抗蚀剂组合物; 调整基板的旋转速度在500〜1500rpm的范围内,调整涂布的抗蚀剂组合物的膜厚; 并且对抗蚀剂组合物进行干燥,曝光和显影,其中抗蚀剂组合物包括:(A)在用光化射线和辐射之一照射时能够产生酸的化合物; (B)在碱性显影剂中的溶解速率在酸的作用下增加的树脂; (C)混合溶剂; 和(D)表面活性剂,并且混合溶剂(C)包括选自溶剂组A和选自B组溶剂中的至少一种的至少一种,或者包括选自A组 的溶剂和选自溶剂组C中的至少一种:A组:丙二醇单烷基醚羧酸酯,B组:丙二醇单烷基醚,乳酸烷基酯,乙酸酯,链和环酮之一和烷氧基烷基丙酸酯, 和C组:3-丁内酯,碳酸亚乙酯和碳酸亚丙酯。