摘要:
The invention relates to a sensor (10) for measurement of the deflection of a machine element (17). The sensor comprises a detecting portion (11), a light source (24), a light detector (26), and connected guides (20,25,27). An electronic data processing unit (28) is connected to the sensor. The detecting portion comprises a tuft (13) of optical fibres, a focusing lens (14) fitted into a tube (12), and a mirror (15) separated from the tube (12). The deflection of the machine element (17) caused by the work piece (23) results in an inclination of the mirror (15) relative to the center line of the tube, and therefore a light beam from the light source (24) coming into an optical fiber in the tuft is reflected in the mirror towards a point on the end of the fiber tuft which is arranged at a distance from said center line. This reflected light is transferred to the light detector (26) for transmission of an analogous signal to the electronic unit (28) in which the value of the deflection is determined.
摘要:
La présente invention concerne un système de repérage de la position angulaire d'un dispositif mécanique. L'invention consiste à envoyer l'image d'une fente (1) de largeur prédéterminée sur un miroir (M) solidaire dudit dispositif mécanique et à la réfléchir sur un récepteur semi-conducteur (2) comportant une barrette d'éléments photosensibles et un dispositif à couplage de charge, des moyens pour déduire la position angulaire duditdispositif mécanique et des moyens de correction de la lecture de la mesure fournie.
摘要:
The invention pertains to a method of detecting a rotation of an object over an axis coinciding with an optical axis of a probe beam, the method comprising providing a probe beam. The probe beam is comprised of two monochromatic wavelengths with mutually circular polarizations of opposite chirality, having a fixed frequency difference for providing a heterodyne probe beam. A neutral beam splitter is provided that directs a reflected beam via a polarizer filter towards a first photodetector and that directs a transmitted beam towards a quarter wave plate attached, via a mirror to a rotatable body. The mirror reflects the probe beam, via the quarter wave plate, back into the neutral beam splitter, which directs the reflected beam via a polarizer filter towards a second photodetector. The rotation is derived from a phase difference between the first and second photodetector signals.
摘要:
In the present invention a Fabry-Perot optical sensor is disclosed comprising an optical cavity (20) defined by the exit of the waveguide and a second end (10b) opposite to said exit (10b). The exit (24) of the optical cavity (20) is closed by a deformable plug (60) and a mobile reflector element (40) is arranged in said optical cavity (20). The reflector element (40) has a reflecting surface (42) to the side of said second end (10b) and a second surface (44) opposite to the reflecting surface (42), said reflecting surface (42) is arranged to reflect at least partially said incident light beam (200). The optical cavity (20) comprises a volume of a gas (50) situated between said entry (22) and said reflecting surface (42). A deformable plug (60) closes the exit (24) of the optical cavity (20). The deformable plug (60) is configured so that the deformation thereof results in a displacement of the reflector element (40) along said cavity axis (21).
摘要:
An optoelectronic device for measuring linear displacements comprising two elements (1, 2) which are displaced with respect to one another, and a method for determining at least one angle of rotation therein. The second element (2) illuminates a reflective surface of the first element (1) and receives at least part of the light reflected off said surface (10) in a receiving area. The device (100) comprises a window (4) with successive partial zones having different light transmission properties, and the light emitted for illuminating the reflective surface (10) is made to pass therethrough before being received in the receiving area. The light intensity distribution generated in the receiving area is compared with a light intensity distribution pattern for determining the pitch angle (α) between both elements (1, 2).