INSTANTANEOUS POLARIZATION MEASUREMENT SYSTEM AND METHOD
    42.
    发明公开
    INSTANTANEOUS POLARIZATION MEASUREMENT SYSTEM AND METHOD 审中-公开
    瞬时极化测量系统和方法

    公开(公告)号:EP1642099A1

    公开(公告)日:2006-04-05

    申请号:EP03818023.8

    申请日:2003-07-08

    Abstract: The invention provides a highly sensitive measurement of retardance and slow axis orientation, accurately and instantaneously, across a full two-dimensional image. There are no moving parts and there need not be any electro-optic tuning as part of the meas urement. It is ideally adapted to real-time imaging and is well-suited to use with biological and medical samples, including visualizing structures in oocytes. The invention splits a light beam (109) nto several beams, which are analyzed using elliptical pola rizers (111a-111c)and the resultant intensity is measured. It can be constructed using a single pixilated detector(116), or sever al detectors, to achieve high spatial resolution when this is desired.

    Abstract translation: 本发明在整个二维图像上准确且瞬时地提供延迟和慢轴取向的高度灵敏的测量。 没有移动部件,不需要进行电光调谐作为测量的一部分。 它非常适合实时成像,非常适合用于生物和医学样品,包括可视化卵母细胞中的结构。 本发明将光束(109)分成数束,使用椭圆偏振器(111a-111c)分析并测量所得的强度。 它可以使用单个像素化探测器(116)或多个探测器来构建,以在需要时实现高空间分辨率。

    POLARIZATION MODULATION PHOTOREFLECTANCE CHARACTERIZATION OF SEMICONDUCTOR QUANTUM CONFINED STRUCTURES
    43.
    发明公开
    POLARIZATION MODULATION PHOTOREFLECTANCE CHARACTERIZATION OF SEMICONDUCTOR QUANTUM CONFINED STRUCTURES 审中-公开
    量子约束半导体结构的极化调制PHOTOREFLEKTANZ表征

    公开(公告)号:EP1636555A2

    公开(公告)日:2006-03-22

    申请号:EP04752613.2

    申请日:2004-05-19

    Abstract: A polarization modulation photoreflectance technique has been developed for optical characterization of semiconductor quantum confined structures. By using a tunable laser source in conjunction with polarization state modulation, a single beam modulation spectroscopy technique may be used to characterize the optical response of semiconductor materials and structures. Disclosed methods and instruments are suitable for characterization of optical signatures of quantum electronic confinement, including resolution of excitonic states at the band edge or other direct or indirect critical points in the band structure. This allows for characterization of semiconductor quantum well structures, for characterization of strain in semiconductor films, and for characterization of electric fields at semiconductor interfaces.

    APPARATUS AND METHOD FOR IMAGING
    45.
    发明公开
    APPARATUS AND METHOD FOR IMAGING 审中-公开
    装置和方法用于说明

    公开(公告)号:EP1470401A1

    公开(公告)日:2004-10-27

    申请号:EP03702096.3

    申请日:2003-01-10

    CPC classification number: G01N21/21 G01N21/552 G01N21/553

    Abstract: Apparatus for acquiring an image of a specimen comprising a cassette (300, 302a, 302b) having an optical portion (312) holding a specimen array on a TIR surface (314) and being removably matable to a processing portion having a polarized light beam source and a processing polarization sensitive portion to image the spatially distributed charges in polarization of the specimen array. In one form the array optical portion comprises a transparent slide (312) having a bottom surface with first and second gratings located to direct polarized light to the TIR surface (314) and to direct light reflected by that (TIR) surface to an imager, respectively. The apparatus may include a flow cell (316) integral with the optical portion (312) as well as means for selecting the direction and wavelength of the polarized light.

    CURING LAMP APPARATUS WITH ELECTRONIC VOICE
    46.
    发明公开
    CURING LAMP APPARATUS WITH ELECTRONIC VOICE 审中-公开
    具有电子声音的固化灯装置

    公开(公告)号:EP1436806A2

    公开(公告)日:2004-07-14

    申请号:EP02773753.5

    申请日:2002-10-15

    CPC classification number: H05B39/041 A61C19/003 H05B39/042 Y02B20/14

    Abstract: A curing lamp apparatus is used for providing electronic voice information to report a number of operating conditions associated with the curing lamp (40). The apparatus includes a light sensor for sensing output power (240), voltage and current sensors for sensing input power (45-48), a microcontroller for providing a digital number in response to receiving signals from one or more sensors (70), a programmed voice circuit for retrieving a voice message signal from a memory (140), address associated with the digital number (110), and a transducer for receiving and audibly reproducing the voice message signal (130).

    Abstract translation: 使用固化灯设备来提供电子语音信息以报告与固化灯(40)相关联的多个操作条件。 该设备包括用于感测输出功率的光传感器(240),用于感测输入功率(45-48)的电压和电流传感器,用于响应于从一个或多个传感器(70)接收信号而提供数字数字的微控制器, 用于从存储器(140)中检索话音消息信号的程序化话音电路,与数字号码(110)相关联的地址以及用于接收和可听地再现话音消息信号(130)的换能器。

    ACCURACY CALIBRATION OF BIREFRINGENCE MEASUREMENT SYSTEMS
    47.
    发明公开
    ACCURACY CALIBRATION OF BIREFRINGENCE MEASUREMENT SYSTEMS 审中-公开
    双参数测量系统的精度标定

    公开(公告)号:EP1436579A1

    公开(公告)日:2004-07-14

    申请号:EP02784190.7

    申请日:2002-10-16

    Inventor: WANG, Baoliang

    CPC classification number: G01J4/04 G01N21/23

    Abstract: Provided are systems and methods using a Soleil-Babinet compensator (101) as a standard for calibrating birefringence measurement systems. Highly precise and repeatable calibration is accomplished by the method described here because, among other things, the inventive method accounts for variations of retardance across the surface of the Soleil-Babinet compensator (101). The calibration technique described here may be employed in birefringence measurement systems that have a variety of optical setups for measuring a range of retardation levels and at various frequencies of light sources.

    Abstract translation: 提供使用Soleil-Babinet补偿器(101)作为校准双折射测量系统的标准的系统和方法。 通过此处描述的方法实现高度精确和可重复的校准,因为除其他之外,本发明的方法考虑了Soleil-Babinet补偿器(101)表面上延迟的变化。 这里描述的校准技术可以用在双折射测量系统中,该系统具有多种光学设置用于测量延迟水平的范围和光源的各种频率。

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