摘要:
A probe device (19) for a rotating head (18) of a rotary system comprises at least one support arm (20, 21) that is mounted so as to be rotatable about an axis of rotation (22), at least one probe (23) that is connected to the support arm (20, 21), and at least one cable guide for guiding a probe cable. The cable guide comprises a first end portion (25) that extends along the support arm (20, 21), from the probe (23) to the axis of rotation (22), and a second end portion (26) that originates essentially at the axis of rotation (22).
摘要:
A device for measuring and optionally correcting the angular offset of two shafts which are connected to one another by way of two universal joints and a third shaft calls for the measurement heads of an optoelectronic alignment device to be adjustably arranged on the shafts by means of at least one pivot joint on one of the clamping devices, with an adjustment capacity. A pertinent method contains matching of the orientation of the measurement heads of the optoelectronic alignment device on the shafts in at least two measurement positions by adjusting the pivot joint.
摘要:
The invention relates to a coupling device for connecting a first shaft (10) to a second shaft (12) by means of two flanges (16, 18, 22, 24) that are meshed with one another, wherein the flanges are provided or designed with means (30, 32, 111, 211, 311, 317, 319, 321) of enabling the axial and/or radial relative adjustment thereof due to a misalignment of the shafts to be visually observed. According to one variant, at least one of the flanges or an element (20, 26) meshed with the two flanges is provided with at least one converter (50, 60, 70, 80, 90; 94) for generating an electrical signal and/or acoustic signal from a mechanical movement, wherein said converter is designed to generate the signal on the basis of a periodic movement of the flanges relative to one another, at least if the relative movement of the two shafts to one another, which occurs as the shafts rotate due to a misalignment of said shafts, exceeds a certain value.
摘要:
The invention relates to a device for detecting the position of a first mechanical element (10, 110) and a second mechanical element (14, 110) relative to one another, having a first measuring unit (18) for placing against the first mechanical element, a second measuring unit (22) for placing against the second mechanical element, and an evaluating unit (24), wherein the device has means (49; 138; 42, 238) for generating a first optical pattern (38) at the first measuring unit, and means (49; 140, 141; 240) for generating a second optical pattern (40) at the second measuring unit, wherein the second measuring unit has a beam splitter (42), which is turned towards the first measuring unit. The measuring units being placed against the respective mechanical element, wherein the second optical pattern, seen from the first measuring unit, is arranged behind the beam splitter, wherein the first measuring unit has a camera (30) with detector (32) and focusing optics (34), in order to replicate an overlay of the first optical pattern reflected at the beam splitter and of the second optical pattern on the detector transmitted through the beam splitter, and wherein the evaluating unit is designed for detecting, from the relative positions of the image of the first optical pattern and the second optical pattern on the detector, the position of the first mechanical element and of the second mechanical element relative to one another.
摘要:
The invention relates to a compact vibration meter which comprises at least two vibration sensors and in which the transmission of vibrations of the regions of a support element that include the sensors is adjusted to the frequency range to be sensed by the respective sensor.
摘要:
A test set-up (10) for non-destructive detection of a flaw in a device under test by means of an eddy current comprises an excitation coil (14), to which an excitation signal (SE) can be provided to act on the device under test (16) with an electromagnetic alternating field, a receiving coil (17) to generate a coil signal (SP), which is a function of the flaw in the device under test (16), an analog-digital converter (21), which is coupled to the receiving coil (17) on the input side, a filter arrangement (22), which is coupled to the analog-digital converter (21) on the input side and is designed for band-pass filtering and scan rate reduction, and a demodulator (27), which is coupled to an output of the filter arrangement (22) on the input side.