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公开(公告)号：EP1609164A1
公开(公告)日：2005-12-28
申请号：EP03708379.7
申请日：2003-03-13
IPC分类号： H01J37/00
摘要： I A dual- and triple- mode cantilever (10) suitable for simultaneously measuring both normal “adhesion” and lateral “friction” forces independently in three orthogonal directions. The cantilever design allows the measurements to be performed at high sensitivity. The cantilever is useful in Scanning Probe Microscopes “SPM's” and other force-measuring devices, such as the Atomic Force Microscope “AFM”, the Friction Force Microscope “FFM”, and in probe attachments for the Surface Forces Apparatus “SFA” where both normal and lateral forces acting on a tip need to be accurately and unambiguously measured. The cantilever structure may be used for both resistive and optical detection of tip (13) deflections.
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公开(公告)号：EP2859360A1
公开(公告)日：2015-04-15
申请号：EP13742483.4
申请日：2013-06-10
申请人： Israelachvili, Jacob
发明人： Israelachvili, Jacob
CPC分类号： G01N13/00 , B01L3/00 , G01N1/00 , G01N1/28 , G01N3/04 , G01N19/02 , G01Q30/02 , G01Q30/18 , G01Q30/20 , G01Q70/02 , G02B21/26
摘要： A mounting system for samples and instruments for use with a measuring device such as a surface forces apparatus has a housing and a sample mount assembly positioned within the housing. The sample mount assembly has a pivot arm having a first edge and a flexing section. A spring has a first end coupled to the pivot arm. A first sample holder is coupled to the second end of the spring. A second sample holder is positioned in proximity to the first sample holder.
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