公开(公告)号：EP0721577B1

公开(公告)日：1998-09-30

申请号：EP94911983.8

申请日：1994-04-21

申请人： KIMMEL, Jyrki

发明人： KIMMEL, Jyrki

IPC分类号： G01M11/02

CPC分类号： G01M11/35

摘要： A device for examining optical waveguides comprises a prism (2) to be positioned on the waveguide to be investigated (1), a point (7) at which incoming light enters the device, as well as control accessories to alter the angle of light directed to the prism (2) from the entering point (7) of incoming light. The control accessories include a mirror (3) whereby the projection of the reflecting surface of the mirror in the plane of altering the said angle is in the form of an ellipse. A rotatable mirror (4) is placed at the focal point (F1) of the said ellipse, the corner of the prism (2) being situated at the second focal point (F2) of the same ellipse.

公开(公告)号：EP0721577A1

公开(公告)日：1996-07-17

申请号：EP94911983.0

申请日：1994-04-21

申请人： KIMMEL, Jyrki

发明人： KIMMEL, Jyrki

IPC分类号： G01M11

CPC分类号： G01M11/35

摘要： A device for examining optical waveguides comprises a prism (2) to be positioned on the waveguide to be investigated (1), a point (7) at which incoming light enters the device, as well as control accessories to alter the angle of light directed to the prism (2) from the entering point (7) of incoming light. The control accessories include a mirror (3) whereby the projection of the reflecting surface of the mirror in the plane of altering the said angle is in the form of an ellipse. A rotatable mirror (4) is placed at the focal point (F1) of the said ellipse, the corner of the prism (2) being situated at the second focal point (F2) of the same ellipse.