SPM IMAGING APPARATUS, PROBE AND METHOD
    2.
    发明公开
    SPM IMAGING APPARATUS, PROBE AND METHOD 有权
    SPM测量装置,探头及测量方法

    公开(公告)号:EP2250480A1

    公开(公告)日:2010-11-17

    申请号:EP09719209.0

    申请日:2009-03-12

    IPC分类号: G01N13/16 G12B21/08

    摘要: An elongate probe (50) for use in probe microscopy comprises a module (51) provided between a probe tip (53) and a driver (52). In use the driver (52) applies oscillations to the module (51) which are transmitted by the module to the tip (53). With the probe tip (53) positioned close to the surface of a sample, any phase variance in the oscillation of the tip with respect to the driving oscillation is representative of an interaction between the tip and the sample surface. The elongate arrangement of the probe (50) is particularly beneficial when used to probe samples which require a liquid environment.