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公开(公告)号:EP4339630A1
公开(公告)日:2024-03-20
申请号:EP22386062.8
申请日:2022-09-13
申请人: ABB SCHWEIZ AG
摘要: The present invention relates to the field of electric drive devices and arrangements comprising a plurality of power semiconductor components formed in or on a common substrate, and more particularly to a method and an apparatus for monitoring the condition of a power semiconductor module. The method for monitoring the condition of a power semiconductor module of an electric drive device connected to an electric machine comprises the steps of engaging (42) a locking of the rotor of said electric machine at zero speed or at near zero speed by injecting DC currents by said electric drive device, initiating (43) test temperature recording in said power semiconductor module, disengaging (44) said locking the rotor of said electric machine by said electric drive device, terminating (45) said test temperature recording and storing the recorded data of the test temperature as test temperature data, and determining (47) the condition of the power semiconductor module utilising said test temperature data.
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公开(公告)号:EP4339629A1
公开(公告)日:2024-03-20
申请号:EP22195844.0
申请日:2022-09-15
申请人: ABB SCHWEIZ AG
发明人: Vulli, Aleksi , Schlottig, Gerd , Bianda, Enea , Orkisz, Michal , Firla, Marcin
摘要: According to an aspect, there is provided an apparatus for performing the following. The apparatus maintains, in a memory, information on a computational model for thermal behavior of layers of an insulated-gate bipolar transistor, IGBT, module (501). The apparatus obtains measurements of the dissipated power at the semiconductors and the ambient temperature and determines one or more current values of one or more temperatures of the IGBT module (501) based on a switching delay of the IGBT module (501). The apparatus calculates a current estimate of a joint state-parameter space of the computational model using a Bayesian filter and the computational model taking as inputs the dissipated power and the ambient temperature. The joint state-parameter space comprises the one or more temperatures, one or more thermal loss parameters and one or more wear parameters. The one or more current values of the one or more temperatures are used as observations in the Bayesian filter.
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