专利检索 ap:("Advacam s.r.o.") AND inv:"UHER, Josef" 第 1 页

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发明公开
A METHOD OF DETECTION OF DEFECTS IN MATERIALS WITH INTERNAL DIRECTIONAL STRUCTURE AND A DEVICE FOR PERFORMANCE OF THE METHOD 审中-公开

公开(公告)号：EP3350583A1

公开(公告)日：2018-07-25

申请号：EP16781659.4

申请日：2016-09-14

申请人： Advacam s.r.o.

发明人： JAKUBEK, Jan , UHER, Josef

IPC分类号： G01N23/18 , G01N23/04 , G01N23/22

CPC分类号： G01N23/18 , G01N23/04 , G01N23/2206

摘要： Problem to be resolved: Non-destructive detection of directional and other defects in structured materials that cannot be detected by current detection and imaging methods. Problem solution: The problem has been resolved by inclining the incident beam of ionizing radiation irradiating the examined object (3), while knowing the geometry of positions of the object (3), source (2) of beams ionizing radiation and detector (8), including the size of the angle of incidence (a). Based on detection of an attenuated or dispersed beam of ionizing radiation an image is obtained of directional defects in the material with internal structure.