公开(公告)号：EP3403238A1

公开(公告)日：2018-11-21

申请号：EP16705331.3

申请日：2016-01-11

申请人： Carl Zeiss X-Ray Microscopy, Inc.

发明人： BHATTIPROLU, Sreenivas Naga ,  WAITE, Tom

IPC分类号： G06T7/00 ,  G01N33/24 ,  G01N23/04 ,  G01V8/00 ,  H01J37/28

CPC分类号： G06T7/0004 ,  G01N23/2206 ,  G01N23/225 ,  G01N33/24 ,  G06T7/11 ,  G06T2207/10061 ,  G06T2207/10081 ,  G06T2207/20084 ,  G06T2207/30132 ,  H01J2237/221

摘要： A multimodality imaging system and method for mineralogy segmentation is disclosed. Image datasets of the sample are generated for one or more modalities, including x-ray and focused ion beam scanning electron microscope (FIB-SEM) modalities. Mineral maps are then created using Energy Dispersive X-ray spectroscopy (EDX) from at least part of the sample covered by the image datasets. The EDX mineral maps are applied as a mask to the image datasets to identify and label regions of minerals within the sample. Feature vectors are then extracted from the labeled regions via feature generators such as Gabor filters. Finally, machine learning training and classification algorithms such as Random Forest are applied to the extracted feature vectors to construct a segmented image representation of the sample that classifies the minerals within the sample.

公开(公告)号：EP3350583A1

公开(公告)日：2018-07-25

申请号：EP16781659.4

申请日：2016-09-14

申请人： Advacam s.r.o.

发明人： JAKUBEK, Jan ,  UHER, Josef

IPC分类号： G01N23/18 ,  G01N23/04 ,  G01N23/22

CPC分类号： G01N23/18 ,  G01N23/04 ,  G01N23/2206

摘要： Problem to be resolved: Non-destructive detection of directional and other defects in structured materials that cannot be detected by current detection and imaging methods. Problem solution: The problem has been resolved by inclining the incident beam of ionizing radiation irradiating the examined object (3), while knowing the geometry of positions of the object (3), source (2) of beams ionizing radiation and detector (8), including the size of the angle of incidence (a). Based on detection of an attenuated or dispersed beam of ionizing radiation an image is obtained of directional defects in the material with internal structure.

公开(公告)号：EP1632770B1

公开(公告)日：2008-06-18

申请号：EP05016384.9

申请日：2005-07-28

申请人： Bruker AXS, Inc.

发明人： Boaping, He Bob ,  Frampton, Christopher S. ,  Burgäzy, Frank W.

IPC分类号： G01N23/22 ,  G01N23/20

CPC分类号： G01N23/2206 ,  B01J2219/00707 ,  G01N23/20 ,  G01N23/20016 ,  G01N23/227

公开(公告)号：EP0523566B1

公开(公告)日：2001-11-21

申请号：EP92111801.4

申请日：1992-07-10

申请人： INTERNATIONAL SUPERCONDUCTIVITY TECHNOLOGY CENTER ,  FUJIKURA LTD. ,  SHOWA ELECTRIC WIRE & CABLE CO.,LTD.

发明人： Usui, Toshio, c/o SUPERCONDUCTIVITY RES. LAB. ,  Aoki, Yuji, c/o SUPERCONDUCTIVITY RES. LAB. ,  Kamei, Masayuki, c/o SUPERCONDUCTIVITY RES. LAB. ,  Morishita, Tadataka, c/o SUPERCONDUCTIVITY RES.LAB

IPC分类号： G01N23/22 ,  G01N23/225 ,  H01J37/295 ,  H01J37/244 ,  H01J37/256

CPC分类号： G01N23/2252 ,  G01N23/2206 ,  G01N23/2208

公开(公告)号：EP0628165A1

公开(公告)日：1994-12-14

申请号：EP93904266.0

申请日：1993-02-26

申请人： SERVICES PETROLIERS SCHLUMBERGER ,  SEDCO FOREX TECHNOLOGY INC.

发明人： GILMOUR, Alan, Dowell Schlumberger (Nigeria) Ltd. ,  HOUWEN, Otto ,  SANDERS, Mark

IPC分类号： E21B49 ,  G01N23

CPC分类号： G01N23/2206 ,  E21B49/005

摘要： Procédé d'analyse d'un fluide de forage s'effectuant au moyen de la soumission d'un échantillon de fluide à une technique d'analyse de fluorescence de rayons X (XRF) et de la comparaison des résultats obtenus avec un modèle d'étalonnage, afin de déterminer la quantité d'un ou plusieurs constituants dudit fluide présent dans l'échantillon. Le procédé est particulièrement efficace pour déterminer la présence de solides dans le fluide tels que des barytes et peut se combiner à une technique d'analyse du spectre d'infrarouges (FTIR) sensible à d'autres constituants dudit fluide. On utilise un algorithme obtenu au moyen d'une technique de régression PLS, afin de construire le modèle à partir des spectres.

公开(公告)号：EP0348574A3

公开(公告)日：1990-05-23

申请号：EP88310137.0

申请日：1988-10-28

申请人： KAWASAKI STEEL CORPORATION

发明人： Kawabe, Junji c/o Technical Research Division ,  Hashiguchi, Koichi c/o Technical Research Division

IPC分类号： G01N23/20 ,  G01N23/22

CPC分类号： G01B15/02 ,  G01N23/2206

摘要： A film (8) as being a subject to be measured is irradiated by an X-ray (13) from a single X-ray source (12), whereby the intensity of the diffracted X-ray of a crystalline substance contained in the film and the intensity of the fluorescent X-ray of an element composing the film are simultaneously detected by at least two X-ray intensity detectors (14C, 14A), respectively, so that the thickness and composition of the film at the same position are simultaneously determined from the both detected values.

公开(公告)号：EP0318012A2

公开(公告)日：1989-05-31

申请号：EP88119611.7

申请日：1988-11-24

申请人： HITACHI, LTD. ,  HORIBA, LTD.

发明人： Yamamoto, Naoki ,  Takano, Yukio ,  Hosokawa, Yoshinori ,  Yoshino, Kenji

IPC分类号： G01N23/207 ,  G01N23/223

CPC分类号： G01N23/2076 ,  G01N23/2206

摘要： The X-ray analyzer is arranged for conduction both an X-ray fluorescence analysis and X-ray diffraction comprises an X-­ray source (1), an X-ray guide tube (2) for collecting X-­ray emitted from said X-ray source (1), a sample table (4) disposed in the vicinity of an end of said X-ray guide tube (2) for placing a sample to be subjected to the application of the above described X-rays thereon, and an X-ray detect­or (6). Said sample table (4) and said X-ray detector (6) are disposed within the same one vacuum tank (5) and an in­side of said X-ray guide tube (2) is opened into said va­cuum tank (5). Preferably, the X-ray guide tube (2) compri­ses at least in the range of an X-ray beam outlet a para­boloid of revolution shape with an essentially cylinder type of an outlet end tube portion (23). With the X-ray analyzer according to the present invention, the X-ray beams are highly parallel to each other, so that is is easy to set the conditions for the total reflection of the beams incident upon the sample, whereby for example, the so-call­ed total reflection XS-ray fluorescence analysis becomes possible.

摘要翻译： 所述X射线分析装置被配置为导通，所述X射线荧光分析和X射线衍射均包括X射线源（1），X射线导管（2），用于收集从所述X射线源发射的X射线， 射线源（1），设置在所述X射线引导管（2）的端部附近的样品台（4），用于放置要在其上施加上述X射线的样品，以及 X射线检测器（6）。 所述样品台（4）和所述X射线检测器（6）设置在相同的一个真空罐（5）内，并且所述X射线引导管（2）的内部被打开到所述真空罐（5）中。 优选地，X射线引导管（2）至少在X射线束出口的范围内包括基本上圆柱形的出口端管部分（23）的旋转抛物面。 利用根据本发明的X射线分析仪，X射线束彼此高度平行，因此容易设定入射到样品上的光束的全反射的条件，从而例如 所谓的全反射XS射线荧光分析成为可能。

公开(公告)号：EP0202937A2

公开(公告)日：1986-11-26

申请号：EP86303888.1

申请日：1986-05-22

申请人： TEKSCAN LIMITED

发明人： McDonnell, Liam "Roisin Rubh" ,  Cashell, Eamonn M. "Copper Beeches"

IPC分类号： G01N23/225 ,  G01N23/227 ,  G01N23/22 ,  H01J49/48 ,  H01J49/06 ,  H01J37/252 ,  G01N25/72

CPC分类号： G01N23/2206 ,  G01N21/1702 ,  G01N25/72 ,  H01J37/252 ,  H01J49/06 ,  H01J49/482

摘要： In an apparatus for surface analysis microscopy, a number of analysis devices (5, 11) are mounted on an ultra-high vacuum chamber (1). The devices (5, 11) include a beam source for locally heating a selected region of a specimen and a temperature-detector for monitoring the heating of the selected region, as well as an electron gun (11) and an analyser (5) for detecting emission from a specimen region subjected to electron bombardment. An ion gun may also be provided. The apparatus enables thermal microscopy of a specimen to be carried out in conjunction with other surface analysis techniques including, inter alia, scanning electron microscopy and Auger electron microscopy, within a single apparatus and during a single experimental operation. A novel configuration of cylindrical mirror analyser facilitates mounting a multiplicity of analysis devices on the chamber in a compact manner for studying a specimen at a single position.

公开(公告)号：EP2259051B1

公开(公告)日：2018-10-10

申请号：EP09720348.3

申请日：2009-03-13

申请人： Japan Science and Technology Agency

发明人： FUJITA, Jun-ichi

IPC分类号： G01N23/225

CPC分类号： G01N23/2251 ,  G01N23/2206 ,  H01J2237/244

摘要： A method which visualizes the distribution of a local electric field formed near a sample 2 is disclosed. A primary electron beam 1 which passes through the local electric field formed near the sample 2 is deflected by the local electric field, secondary electrons which are generated and emitted from a detection element provided downstream of an orbit of the deflected primary electron beam 1 are detected by a secondary electron detector 6, and an image formed based on the detected signal and a scanning electron beam image obtained by scanning the sample 2 are synthesized thus visualizing the distribution of the local electric field in multiple tones. Due to such an operation, it is possible to provide a method for visualizing the distribution of a local electric field in which the distribution of a local electric field can be obtained in multiple tone and in real time by performing image scanning one time using a usual electron beam scanning optical system.

公开(公告)号：EP2259051A4

公开(公告)日：2017-03-08

申请号：EP09720348

申请日：2009-03-13

申请人： JAPAN SCIENCE & TECH AGENCY

发明人： FUJITA JUN-ICHI

IPC分类号： G01N23/225

CPC分类号： G01N23/2251 ,  G01N23/2206 ,  H01J2237/244

摘要： A method which visualizes the distribution of a local electric field formed near a sample 2 is disclosed. A primary electron beam 1 which passes through the local electric field formed near the sample 2 is deflected by the local electric field, secondary electrons which are generated and emitted from a detection element provided downstream of an orbit of the deflected primary electron beam 1 are detected by a secondary electron detector 6, and an image formed based on the detected signal and a scanning electron beam image obtained by scanning the sample 2 are synthesized thus visualizing the distribution of the local electric field in multiple tones. Due to such an operation, it is possible to provide a method for visualizing the distribution of a local electric field in which the distribution of a local electric field can be obtained in multiple tone and in real time by performing image scanning one time using a usual electron beam scanning optical system.