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公开(公告)号:EP0129588A4
公开(公告)日:1985-12-12
申请号:EP84900354
申请日:1983-12-14
申请人: BURROUGHS CORP
IPC分类号: D01F9/08 , C23C16/24 , C23C16/44 , C23C16/52 , H01L21/18 , H01L21/205 , H01L21/225 , H01L21/3205
CPC分类号: H01L21/32055 , C23C16/24 , C23C16/44 , H01L21/02532 , H01L21/02576 , H01L21/0262
摘要: A method of fabricating a film of in-situ doped polycrystalline silicon having a surface that is free of microscopic hillocks includes the steps of providing a deposition chamber and a wafer therein on which the film is to be fabricated and introducing one gas containing silicon atoms and another gas containing dopant atoms into said chamber with respective flow rates; wherein the respective flow rate are gradually increased in an overdamped fashion over a start-up time interval of at least one minute from zero to respective steady state values while simultaneously the ratio of the respective flow rates is kept within 25% of the ratio of said steady state values.