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公开(公告)号:EP4411360A1
公开(公告)日:2024-08-07
申请号:EP22875959.3
申请日:2022-09-21
发明人: ABE, Katsuichi , ENOKIDO, Fuka , MIURA, Jun , MAEDA, Harunobu , TANAKA, Masanori , FUKATSU, Makoto , MATSUKAWA, Akihisa , IKAMI, Yasukazu , MIYAZAKI, Keiji , YAMAMOTO, Takeshi
IPC分类号: G01N27/30 , B01J19/00 , G01N27/28 , G01N27/416
CPC分类号: G01N27/30 , B01J19/00 , G01N27/28 , G01N27/416
摘要: An object is to provide a microanalysis chip with which influence on a working electrode due to backflow of ions from a reference electrode region to a working electrode region can be suppressed and stable ion concentration measurement can be performed without increasing a chip size or prolonging a measurement time. In order to achieve this object, the following microanalysis chip is provided. That is, provided is a microanalysis chip in which: a first channel chamber has a reference electrode arranged therein, the reference electrode having a surface on which an ion crystal having specimen solubility is arranged; a second channel chamber has a working electrode arranged therein; and a first channel and a second channel are configured so that, when a time period required for a specimen to reach the ion crystal after the specimen is dispensed to a dispensing section is represented by T1 and a time period required for the specimen to reach the working electrode after the specimen is dispensed to the dispensing section is represented by T2, the time period T1 and the time period T2 satisfy a relationship of T1>T2.
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公开(公告)号:EP4299505A1
公开(公告)日:2024-01-03
申请号:EP22759590.7
申请日:2022-02-21
发明人: MATSUKAWA, Akihisa , FUKATSU, Makoto , TANAKA, Masanori , YAMAMOTO, Takeshi , MIYAZAKI, Keiji , MIURA, Jun , MAEDA, Harunobu , ENOKIDO, Fuka , TERUI, Yuhei
摘要: It is possible to provide a microchannel device with excellent resistance to bending and suppressed deterioration in inspection accuracy. A microchannel device has a channel sandwiched between channel walls formed in an inside a porous substrate, the channel wall contains a thermoplastic resin and a wax, and a proportion of the wax in an area of a surface side of the channel wall facing the channel is higher than a proportion of the wax inside the channel wall.
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