公开(公告)号：EP2293086A8

公开(公告)日：2012-01-18

申请号：EP10012000.5

申请日：2006-10-31

申请人： Capres A/S

发明人： Petersen, Dirch Hjort

IPC分类号： G01R1/067

CPC分类号： G01R1/06716

摘要： The present invention relates to a probe (502) for testing electrical properties of test samples (508). The probe may comprise a body (504) having a probe arm (506) defining a proximal and an opposite distal end, the probe arm extending from the body at the proximal end of the probe arm, a first axis defined by the proximal and the distal end. Further, the probe arm may define a geometry allowing flexible movement of the probe arm along the first axis and along a second axis perpendicularly to the first axis and along a third axis orthogonal to a plane defined by the first axis and second axis.