METHOD AND SAMPLING DEVICE FOR DETECTION OF LOW LEVELS OF A PROPERTY/QUALITY TRAIT PRESENT IN AN INHOMOGENEOUSLY DISTRIBUTED SAMPLE SUBSTRATE
    1.
    发明公开
    METHOD AND SAMPLING DEVICE FOR DETECTION OF LOW LEVELS OF A PROPERTY/QUALITY TRAIT PRESENT IN AN INHOMOGENEOUSLY DISTRIBUTED SAMPLE SUBSTRATE 有权
    方法与样探测设备的属性/质量特征水平低品基片不均匀地分布PRESENCE

    公开(公告)号:EP1480751A2

    公开(公告)日:2004-12-01

    申请号:EP03743695.3

    申请日:2003-02-25

    IPC分类号: B01L3/00

    摘要: A process for detecting low levels of a predetermined quality trait in an inhomogeneously distributed particulate substrate (22) involving the steps of: (a) providing a particulate substrate (22) to be analyzed; (b) providing a spectrometer (12) with an electromagnetic detector capable of performing spectroscopic measurements with electromagnetic radiation; (c) providing a rotatable sample holder (14) having a transparent area through which electromagnetic radiation may pass; (d) providing a tumbling member (18) located within the rotatable sample holder (14) for tumbling the particulate substrate (22) contained therein; (e) introducing the particulate substrate (22) into the rotatable sample holder (14); (f) simultaneously rotating and tumbling the particulate substrate (22) contained within the rotatable sample holder (14); and (g) activating the spectrophotometer (12).