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    PROCÉDÉ DE MESURE DE L'ÉPAISSEUR D'UNE COUCHE DE MATÉRIAU CAOUTCHOUTEUX
    3.
    发明公开
    PROCÉDÉ DE MESURE DE L'ÉPAISSEUR D'UNE COUCHE DE MATÉRIAU CAOUTCHOUTEUX 有权
    PROCÉDÉDE MESURE DE L'ÉPAISSEURD'UNE COUCHE DEMATÉRIAUCAOUTCHOUTEUX

    公开(公告)号：EP3234540A1

    公开(公告)日：2017-10-25

    申请号：EP15808594.4

    申请日：2015-12-11

    申请人： Compagnie Générale des Etablissements Michelin ,  Michelin Recherche et Technique S.A.

    发明人： LEDOUX, Thomas ,  MARTIN, Denis ,  PERNOT, Alexandre ,  HEREDIA, Guillaume ,  MENEROUD, Patrick ,  GOEAU, Cédric

    IPC分类号： G01M17/02 ,  G01B7/06

    CPC分类号： G01B7/10 ,  G01M17/02 ,  G01N27/72 ,  G01R33/123

    摘要： The invention relates to a method for measuring the thickness of a layer of rubber-like material, said layer of material comprising a free face in contact with the air and a face connected to an adjacent casing formed by elements which are electrically insulated from one another and contain at least one hysteresis material having a magnetic permeability above that of air. The method comprises the following steps: a step during which a sensor element that emits an alternating magnetic field is brought close to the layer of material of which the thickness is to be measured; a step during which the hysteresis losses in the adjacent casing are measured at the terminals of the sensor element; and a step during which the thickness of the layer of material is evaluated according to the hysteresis losses.

    摘要翻译： 本发明涉及一种用于测量橡胶状材料层的厚度的方法，所述材料层包括与空气接触的自由面和与由相互电绝缘的元件形成的相邻壳体连接的面 并且包含至少一种磁导率高于空气的磁滞材料。 该方法包括以下步骤：发射交变磁场的传感器元件靠近要测量其厚度的材料层的步骤; 在传感器元件的端子处测量相邻壳体中的滞后损耗的步骤; 以及根据滞后损失评估材料层厚度的步骤。